Detection of diffusion welding defects by thermal ndt of rectifier elements; The Soviet journal of nondestructive testing; Vol. 19, iss. 5

Detection of diffusion welding defects by thermal ndt of rectifier elements

Bibliographic Details
Parent link:The Soviet journal of nondestructive testing.— , 1965-
Vol. 19, iss. 5.— 1983.— P. 372-374
Other Authors: Bragina L. A., Vavilov V. P. Vladimir Platonovich, Ivanov A. I., Korol'kov O. M., Surzhenkov G. N., Khutoryanskii E. D.
Summary:Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
В фонде НТБ ТПУ отсутствует
Language:English
Published: 1983
Subjects:
труды учёных ТПУ
Format: Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=601416
Description
Summary:Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
В фонде НТБ ТПУ отсутствует

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