Leach R. K. Richard. (2010). Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010.
Chicago Style (17th ed.) CitationLeach R. K. Richard. Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010, 2010.
MLA citiranjeLeach R. K. Richard. Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010, 2010.
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