APA (7th ed.) Citation

Leach R. K. Richard. (2010). Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010.

Chicago Style (17th ed.) Citation

Leach R. K. Richard. Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010, 2010.

MLA (9th ed.) Citation

Leach R. K. Richard. Fundamental Principles of Engineering Nanometrology. Amsterdam, Elsevier, 2010, 2010.

Warning: These citations may not always be 100% accurate.