Thermal Sensitivity of a Microoptoelectromechanical Evanescent-Coupling-Based Accelerometer; Sensors; Vol. 25, iss. 20

Xehetasun bibliografikoak
Parent link:Sensors.— .— Basel: MDPI AG
Vol. 25, iss. 20.— 2025.— Article number 6388, 17 p.
Erakunde egilea: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности (570)
Beste egile batzuk: Barbin E. S. Evgeny Sergeevich, Kulinich I. Ivan, Nesterenko T. G. Tamara Georgijewna, Koleda A. N. Alexej Nikolajevistch, Myrzakhmetov A. S. Ayan Sayatovich, Mokhovikov D. M. Denis Maksimovich, Vtorushin S. E. Sergey Evgenjevich, Talovskaya A. A. Alena Alekseevna
Gaia:Title screen
This treatise studies the thermal sensitivity of the mechanical and optical transmission coefficients of a microoptoelectromechanical (MOEM) accelerometer based on evanescent coupling in a temperature range from minus 40 to plus 125 °C. Two types of optical measuring transducers are considered: based on a directional coupler and a resonator. This analysis covers the optical and mechanical components of the thermal sensitivity of the transmission coefficient. In terms of the mechanical part, the temperature effect induces changes to the linear dimensions of the structure and material characteristics and causes internal mechanical stresses as well. The temperature effect on the optical system of the accelerometer is conditioned by the thermo-optic effect of the materials the optical waveguides are made of. This study includes experiments on the refraction index dependence on the temperature of the optical films that compose the optical system of the MOEM accelerometer. The experiment shows that the refraction index of the films grows with temperature and amounts to 0.12642 ppm/°C for silicon nitride on the SiO2/Si substrate. For the optical measuring transducer based on a directional coupler, the thermal sensitivity of the accelerometer’s optical transmission coefficient is 580 ppm/°C. For the resonator-based transducer, the thermal sensitivity is 0.33 °C−1. The thermal sensitivity of the normalized mechanical transmission coefficient of the accelerometer is 120 ppm/°C. For optical measuring transducers based on a directional coupler, the contribution of the temperature dependent refraction index alteration to the overall error is 5 times larger than that of the MOEM accelerometer’s mechanical parameters, while for the resonator-based transducer the difference reaches 3000 times. This means its operability is only possible in a thermostatic environment
Текстовый файл
Hizkuntza:ingelesa
Argitaratua: 2025
Gaiak:
Sarrera elektronikoa:https://doi.org/10.3390/s25206388
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=687766

MARC

LEADER 00000naa0a2200000 4500
001 687766
005 20260811153441.0
090 |a 687766 
100 |a 20260811d2025 k||y0rusy50 ba 
101 0 |a eng 
102 |a CH 
135 |a drcn ---uucaa 
181 0 |a i   |b  e  
182 0 |a b 
183 0 |a cr  |2 RDAcarrier 
200 1 |a Thermal Sensitivity of a Microoptoelectromechanical Evanescent-Coupling-Based Accelerometer  |f E. Barbin, I. Kulinich, T. Nesterenko [et al.] 
203 |a Текст  |b визуальный  |c электронный 
283 |a online_resource  |2 RDAcarrier 
300 |a Title screen 
320 |a References: 40 tit 
330 |a This treatise studies the thermal sensitivity of the mechanical and optical transmission coefficients of a microoptoelectromechanical (MOEM) accelerometer based on evanescent coupling in a temperature range from minus 40 to plus 125 °C. Two types of optical measuring transducers are considered: based on a directional coupler and a resonator. This analysis covers the optical and mechanical components of the thermal sensitivity of the transmission coefficient. In terms of the mechanical part, the temperature effect induces changes to the linear dimensions of the structure and material characteristics and causes internal mechanical stresses as well. The temperature effect on the optical system of the accelerometer is conditioned by the thermo-optic effect of the materials the optical waveguides are made of. This study includes experiments on the refraction index dependence on the temperature of the optical films that compose the optical system of the MOEM accelerometer. The experiment shows that the refraction index of the films grows with temperature and amounts to 0.12642 ppm/°C for silicon nitride on the SiO2/Si substrate. For the optical measuring transducer based on a directional coupler, the thermal sensitivity of the accelerometer’s optical transmission coefficient is 580 ppm/°C. For the resonator-based transducer, the thermal sensitivity is 0.33 °C−1. The thermal sensitivity of the normalized mechanical transmission coefficient of the accelerometer is 120 ppm/°C. For optical measuring transducers based on a directional coupler, the contribution of the temperature dependent refraction index alteration to the overall error is 5 times larger than that of the MOEM accelerometer’s mechanical parameters, while for the resonator-based transducer the difference reaches 3000 times. This means its operability is only possible in a thermostatic environment 
336 |a Текстовый файл 
461 1 |t Sensors  |c Basel  |n MDPI AG 
463 1 |t Vol. 25, iss. 20  |v Article number 6388, 17 p.  |d 2025 
610 1 |a accelerometer 
610 1 |a optical transducer 
610 1 |a waveguide 
610 1 |a directional coupler 
610 1 |a coupling length 
610 1 |a temperature sensitivity 
610 1 |a transmission coefficient 
610 1 |a coefficient of thermal expansion 
610 1 |a refraction index 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
701 1 |a Barbin  |b E. S.  |c specialist in the field of instrument engineering  |c engineer of Tomsk Polytechnic University  |f 1988-  |g Evgeny Sergeevich  |9 19519 
701 1 |a Kulinich  |b I.  |g Ivan 
701 1 |a Nesterenko  |b T. G.  |c Fachmann auf dem Gebiet des Maschinenbaues  |c Dozent der Polytechnischen Universität Tomsk, Kandidat der technischen Wissenschaften  |f 1946-  |g Tamara Georgijewna  |9 15262 
701 1 |a Koleda  |b A. N.  |c Fachmann auf dem Gebiet des Gerätebaues  |c Ingenieur der Polytechnischen Universitat Tomsk  |f 1985-  |g Alexej Nikolajevistch  |9 17032 
701 1 |a Myrzakhmetov  |b A. S.  |g Ayan Sayatovich 
701 1 |a Mokhovikov  |b D. M.  |g Denis Maksimovich 
701 1 |a Vtorushin  |b S. E.  |g Sergey Evgenjevich 
701 1 |a Talovskaya  |b A. A.  |g Alena Alekseevna 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |c (2017- )  |9 28322  |4 570 
801 0 |a RU  |b 63413507  |c 20260811 
850 |a 63413507 
856 4 0 |u https://doi.org/10.3390/s25206388  |z https://doi.org/10.3390/s25206388 
942 |c CF