Enhancing resolution of terahertz imaging systems below the diffraction limit; Optics and Laser Technology; Vol. 164
| Parent link: | Optics and Laser Technology.— .— Amsterdam: Elsevier Science Publishing Company Inc. Vol. 164.— 2023.— Article number 109540, 8 p. |
|---|---|
| Diğer Yazarlar: | , , , , , , , , |
| Özet: | Title screen We report on resolution enhancement of sub-terahertz (THz) images by using the terajet effect. A mesoscale cuboid dielectric particle, used to establish the terajet, was placed in front of an object located at the focus of the THz beam. The object under study was based on a printed circuit board (PCB) perforated with different holes with diameters ranging from 1.8 to 3.0 mm and separated from each other by a distance that varies from 0.25 to 4 mm. The sample was illuminated by a continuous wave source at a frequency of 0.3 THz and the image was obtained using a sensor based on a strained-Si Field-Effect Transistor. The image was formed pixel-by-pixel in a transmission mode configuration. A clearer image with enhanced resolution was obtained when the mesoscale cube was introduced in the optical path. The terajet effect made possible to resolve a separation between holes of around 0.5 mm (lower than the wavelength, 1 mm), that is, below the diffraction limit. The method described is easy to implement, cost effective and could be used to improve the resolution of any real imaging system Текстовый файл |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
2023
|
| Konular: | |
| Online Erişim: | https://doi.org/10.1016/j.optlastec.2023.109540 |
| Materyal Türü: | Elektronik Kitap Bölümü |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=684991 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 684991 | ||
| 005 | 20260218104736.0 | ||
| 090 | |a 684991 | ||
| 100 | |a 20260218d2023 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a NL | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i |b e | |
| 182 | 0 | |a b | |
| 183 | 0 | |a cr |2 RDAcarrier | |
| 200 | 1 | |a Enhancing resolution of terahertz imaging systems below the diffraction limit |f J. Calvo-Gallego, J. A. Delgado-Notario, O. V. Minin [et al.] | |
| 203 | |a Текст |b визуальный |c электронный | ||
| 283 | |a online_resource |2 RDAcarrier | ||
| 300 | |a Title screen | ||
| 320 | |a References: 36 tit | ||
| 330 | |a We report on resolution enhancement of sub-terahertz (THz) images by using the terajet effect. A mesoscale cuboid dielectric particle, used to establish the terajet, was placed in front of an object located at the focus of the THz beam. The object under study was based on a printed circuit board (PCB) perforated with different holes with diameters ranging from 1.8 to 3.0 mm and separated from each other by a distance that varies from 0.25 to 4 mm. The sample was illuminated by a continuous wave source at a frequency of 0.3 THz and the image was obtained using a sensor based on a strained-Si Field-Effect Transistor. The image was formed pixel-by-pixel in a transmission mode configuration. A clearer image with enhanced resolution was obtained when the mesoscale cube was introduced in the optical path. The terajet effect made possible to resolve a separation between holes of around 0.5 mm (lower than the wavelength, 1 mm), that is, below the diffraction limit. The method described is easy to implement, cost effective and could be used to improve the resolution of any real imaging system | ||
| 336 | |a Текстовый файл | ||
| 461 | 1 | |t Optics and Laser Technology |c Amsterdam |n Elsevier Science Publishing Company Inc. | |
| 463 | 1 | |t Vol. 164 |v Article number 109540, 8 p. |d 2023 | |
| 610 | 1 | |a Diffraction limit | |
| 610 | 1 | |a Image contrast | |
| 610 | 1 | |a Terahertz detectors | |
| 610 | 1 | |a Terajet effect | |
| 610 | 1 | |a Terahertz imaging systems | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 701 | 1 | |a Calvo-Gallego |3 J. |g Jaime | |
| 701 | 1 | |a Delgado Notario |b J. A. |g Juan Antonio | |
| 701 | 1 | |a Minin |b O. V. |c physicist |c professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1960- |g Oleg Vladilenovich |9 21866 | |
| 701 | 1 | |a El |b H. A. |g Hadj Abidi | |
| 701 | 1 | |a Ferrando-Bataller |b M. |g Miguel | |
| 701 | 1 | |a Fobelets |b K. |g Kristel | |
| 701 | 1 | |a Velazquez-Perez |b J. E. | |
| 701 | 1 | |a Minin |b I. V. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1960- |g Igor Vladilenovich |9 20427 | |
| 701 | 1 | |a Meziani |b Y. M. |g Yahya Moubarak | |
| 801 | 0 | |a RU |b 63413507 |c 20260218 | |
| 850 | |a 63413507 | ||
| 856 | 4 | 0 | |u https://doi.org/10.1016/j.optlastec.2023.109540 |z https://doi.org/10.1016/j.optlastec.2023.109540 |
| 942 | |c CF | ||