Thin Ionization Chambers for Multi-Angle Scanning Electron Beam Diagnostics: Development, Calibration, and Experimental Testing

Thin Ionization Chambers for Multi-Angle Scanning Electron Beam Diagnostics: Development, Calibration, and Experimental Testing

Bibliographic Details
Parent link:	Radiation from Relativistic Electrons in Periodic Structures, RREPS-25: book of abstracts XV International Symposium, Shanghai, September 15-19, 2025. P. 72-73.— .— Shanghai: Chinese Laser Press, 2025
Other Authors:	Krylov A. V. Aleksandr Vladimirovich, Bulavskaya A. A. Angelina Aleksandrovna, Baldin A. A. Anton Aleksandrovich, Polomoshnova D. A. Darjya Anatoljevna, Bushmina E. A. Elizaveta Alekseevna, Miloichikova I. A. Irina Alekseevna, Timoshenko K. D. Konstantin Dmitrievich, Mitrofanov S. V. Semen, Alekseev S. V. Sergei, Stuchebrov S. G. Sergey Gennadevich, Semin V. O. Viktor Olegovich
Summary:	Title screen Today, there are various techniques available for beam diagnostics of charged particles, such as electron beams. One such technique is the multi-angle scanning method Текстовый файл
Published:	2025
Subjects:	электронный ресурс труды учёных ТПУ
Online Access:	https://indi.to/M5HL6
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=683502

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