Influence of short-pulsed Ion irradiation on optical and photoelectrical properties of thin gallium oxide films; Optical Materials: X; Vol. 25

Detaylı Bibliyografya
Parent link:Optical Materials: X.— .— Amsterdam: Elsevier Science Publishing Company Inc.
Vol. 25.— 2025.— Article number 100394, 9 p.
Diğer Yazarlar: Koishybayeva Zh. Zhanymgul, Konusov F. V. Fedor Valerievich, Pavlov S. K. Sergey Konstantinovich, Sidelev D. V. Dmitry Vladimirovich, Nassyrbayev (Nasyrbaev) A. Artur, Cheshev D. L. Dmitry Leonidovich, Gadirov R. M. Ruslan Mukhamedzhanovich, Tarbokov V. A. Vladislav Aleksandrovich, Akilbekov A. T. Abdirash Tasanovich
Özet:Title screen
In this work the influence of a short-pulsed ion irradiation with a high flux (∼5.5∙1019 cm−2s−1) on structure, optical and photo-electrical properties of gallium oxide thin films have been investigated. The films were produced by the radio-frequency magnetron sputtering method. A part of deposited films was annealed in the air environment (900 °C, 2 h) for synthesis of β-Ga2O3 phase. Obtained films were subjected to the short-pulsed ion irradiation (ion energy - up to 200 keV, pulse duration - 90 ns, current density on the target - up to 15 A/cm2). The influence of the annealing and the irradiation on spectral dependences of absorption, the bandgap width and the Urbach energy have been determined. It was found that irradiation leads to amorphization of crystalline β-Ga2O3 films and a significant change in optical characteristics. In addition, we measured the magnitude of surface dark and photoconductivity of the films. Also, the field and spectral dependences of the photosensitivity of the films were researched. As a result, it was established that short-pulsed irradiation improves the photoelectric properties of amorphous gallium oxide films. The reasons of it are discussed
Текстовый файл
AM_Agreement
Dil:İngilizce
Baskı/Yayın Bilgisi: 2025
Konular:
Online Erişim:https://doi.org/10.1016/j.omx.2024.100394
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=681878

MARC

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200 1 |a Influence of short-pulsed Ion irradiation on optical and photoelectrical properties of thin gallium oxide films  |f Zhanymgul Koishybayeva, Fedor Konusov, Sergey Pavlov [et al.] 
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330 |a In this work the influence of a short-pulsed ion irradiation with a high flux (∼5.5∙1019 cm−2s−1) on structure, optical and photo-electrical properties of gallium oxide thin films have been investigated. The films were produced by the radio-frequency magnetron sputtering method. A part of deposited films was annealed in the air environment (900 °C, 2 h) for synthesis of β-Ga2O3 phase. Obtained films were subjected to the short-pulsed ion irradiation (ion energy - up to 200 keV, pulse duration - 90 ns, current density on the target - up to 15 A/cm2). The influence of the annealing and the irradiation on spectral dependences of absorption, the bandgap width and the Urbach energy have been determined. It was found that irradiation leads to amorphization of crystalline β-Ga2O3 films and a significant change in optical characteristics. In addition, we measured the magnitude of surface dark and photoconductivity of the films. Also, the field and spectral dependences of the photosensitivity of the films were researched. As a result, it was established that short-pulsed irradiation improves the photoelectric properties of amorphous gallium oxide films. The reasons of it are discussed 
336 |a Текстовый файл 
371 0 |a AM_Agreement 
461 1 |t Optical Materials: X  |c Amsterdam  |n Elsevier Science Publishing Company Inc. 
463 1 |t Vol. 25  |v Article number 100394, 9 p.  |d 2025 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a Gallium oxide 
610 1 |a Thin films 
610 1 |a Radiation resistance 
610 1 |a Magnetron sputtering 
610 1 |a Short-pulsed ion irradiation 
610 1 |a Radiation defects 
610 1 |a Optical properties 
701 1 |a Koishybayeva  |b Zh.  |g Zhanymgul 
701 1 |a Konusov  |b F. V.  |c physicist  |c Lead Engineer of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1958-  |g Fedor Valerievich  |9 16491 
701 1 |a Pavlov  |b S. K.  |c physicist  |c Engineer of Tomsk Polytechnic University  |f 1990-  |g Sergey Konstantinovich  |9 16723 
701 1 |a Sidelev  |b D. V.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1991-  |g Dmitry Vladimirovich  |y Tomsk  |9 17905 
701 1 |a Nassyrbayev (Nasyrbaev)  |b A.  |c Specialist in the field of electric power engineering  |c Research Engineer of Tomsk Polytechnic University  |f 1998-  |g Artur  |9 22370 
701 1 |a Cheshev  |b D. L.  |c Specialist in the field of material science  |c Engineer of Tomsk Polytechnic University  |f 2000-  |g Dmitry Leonidovich  |9 22924 
701 1 |a Gadirov  |b R. M.  |g Ruslan Mukhamedzhanovich 
701 1 |a Tarbokov  |b V. A.  |c specialist in the field of material science  |c Leading engineer of Tomsk Polytechnic University, Candidate of technical sciences  |f 1969-  |g Vladislav Aleksandrovich  |9 21445 
701 1 |a Akilbekov  |b A. T.  |g Abdirash Tasanovich 
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