Enhancing Microhardness and Corrosion Resistance of Anodic Oxides Grown on Hypoeutectic Al–Si Alloys Pretreated by Low-Energy High-Current Electron Beams; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 18, iss. 5

Dettagli Bibliografici
Parent link:Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.— .— New York: Springer Science+Business Media LLC
Vol. 18, iss. 5.— 2024.— P. 1135-1145
Altri autori: Huspek A. L. Lucchini, Akdogan B., Akhmadeev Yu. Kh. Yury Khalyafovich, Petrikova E. A. Elizaveta Alekseevna, Ivanov Yu. F. Yury Fedorovich, Moskvin P. V. Pavel Vladimirovich, Koval N. N. Nikolay Nikolaevich, Bestetti M. Massimiliano
Riassunto:Title screen
Anodic oxidation is widely employed in industry to impart high mechanical properties and improve the corrosion resistance of Al–Si alloys. However, compared to pure Al, the high content of Si prevents the growth of a uniform anodic layer, leading to the formation of cracks and porosities within the oxide. In the present work, low-energy high-current electron beam is used as pretreatment of a hypoeutectic Al–Si alloy to enhance the properties of the anodic oxide. Electron beam modified samples showed a fine and homogenous dispersion of Si in the α-matrix, together with a content reduction of Si in the treated layer. Hard anodic oxides grown on electron beam pre-treated alloys exhibited a higher microhardness, increased by 65%, and a lower corrosion current density, decreased by 94%. Cross-sectional SEM morphology and EDX elemental maps showed less defective anodic oxides, in contrast with oxide formed on as-cast hypoeutectic Al–Si alloys
Текстовый файл
AM_Agreement
Lingua:inglese
Pubblicazione: 2024
Soggetti:
Accesso online:https://doi.org/10.1134/S1027451024700940
Natura: xMaterials Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=681289

MARC

LEADER 00000naa0a2200000 4500
001 681289
005 20250820154508.0
090 |a 681289 
100 |a 20250820d2024 k||y0rusy50 ba 
101 0 |a eng 
102 |a US 
135 |a drcn ---uucaa 
181 0 |a i   |b  e  
182 0 |a b 
183 0 |a cr  |2 RDAcarrier 
200 1 |a Enhancing Microhardness and Corrosion Resistance of Anodic Oxides Grown on Hypoeutectic Al–Si Alloys Pretreated by Low-Energy High-Current Electron Beams  |f A. Lucchini Huspek, B. Akdogan, Yu. H. Akhmadeev [et al.] 
203 |a Текст  |c электронный  |b визуальный 
283 |a online_resource  |2 RDAcarrier 
300 |a Title screen 
320 |a References: 22 tit 
330 |a Anodic oxidation is widely employed in industry to impart high mechanical properties and improve the corrosion resistance of Al–Si alloys. However, compared to pure Al, the high content of Si prevents the growth of a uniform anodic layer, leading to the formation of cracks and porosities within the oxide. In the present work, low-energy high-current electron beam is used as pretreatment of a hypoeutectic Al–Si alloy to enhance the properties of the anodic oxide. Electron beam modified samples showed a fine and homogenous dispersion of Si in the α-matrix, together with a content reduction of Si in the treated layer. Hard anodic oxides grown on electron beam pre-treated alloys exhibited a higher microhardness, increased by 65%, and a lower corrosion current density, decreased by 94%. Cross-sectional SEM morphology and EDX elemental maps showed less defective anodic oxides, in contrast with oxide formed on as-cast hypoeutectic Al–Si alloys 
336 |a Текстовый файл 
371 0 |a AM_Agreement 
461 1 |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques  |c New York  |n Springer Science+Business Media LLC 
463 1 |t Vol. 18, iss. 5  |v P. 1135-1145  |d 2024 
610 1 |a hypoeutectic Al–Si alloy 
610 1 |a high-current low-energy electron beam 
610 1 |a surface modification 
610 1 |a hard anodic oxidation 
610 1 |a corrosion resistance 
610 1 |a microhardness 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
701 1 |a Huspek  |b A. L.  |g Lucchini 
701 1 |a Akdogan  |b B. 
701 1 |a Akhmadeev  |b Yu. Kh.  |g Yury Khalyafovich 
701 1 |a Petrikova  |b E. A.  |g Elizaveta Alekseevna 
701 1 |a Ivanov  |b Yu. F.  |g Yury Fedorovich 
701 1 |a Moskvin  |b P. V.  |g Pavel Vladimirovich 
701 1 |a Koval  |b N. N.  |g Nikolay Nikolaevich 
701 1 |a Bestetti  |b M.  |c physicist  |c Researcher of Tomsk Polytechnic University  |f 1965-  |g Massimiliano  |9 20127 
801 0 |a RU  |b 63413507  |c 20250820  |g RCR 
850 |a 63413507 
856 4 |u https://doi.org/10.1134/S1027451024700940  |z https://doi.org/10.1134/S1027451024700940 
942 |c CF