Analysis of Thermal-Induced Microstructural Changes in Nanoscale Zr/Nb Metal Layers after Proton Irradiation; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 18
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.— .— New York: Springer Science+Business Media LLC. Vol. 18.— 2024.— P. 1482-1489 |
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| Outros autores: | , , , , , |
| Summary: | Title screen The effect of annealing on the microstructure, defect structure, and mechanical properties of nanoscale metal systems consisting of alternating layers of Zr and Nb is considered. The effect of annealing was studied on coatings pre-irradiated with protons. Nanoscale Zr/Nb metal layers were prepared using the magnetron sputtering method, each layer was 50 nm thick, and the total thickness of coatings was about 1 μm. Using electron microscopy and glow discharge optical emission spectrometry, it was shown that the multilayer structure was preserved after both irradiation and annealing of irradiated Zr/Nb samples. After annealing at 300°C, a decrease in hydrogen luminescence intensity and proton redistribution were observed. Using X-ray phase analysis, it was shown that at an annealing temperature of 200°C, the interplanar distances for Zr and Nb decreased. At an annealing temperature of 300°C, a sharp increase in the interplanar distance in Zr layers and a slight decrease in the interplanar distance in Nb layers were detected. Layer-by-layer analysis of defects in nanoscale metal layers using variable-energy positron beam and Doppler broadening spectroscopy showed that increasing the annealing temperature stimulated the migration and annihilation of defects at interfaces. Regions of reduced electron density at the interfaces on the zirconium side remain the predominant positron capture centers Текстовый файл AM_Agreement |
| Idioma: | inglés |
| Publicado: |
2024
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| Subjects: | |
| Acceso en liña: | https://doi.org/10.1134/S102745102470143X |
| Formato: | Electrónico Capítulo de libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=679629 |
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| 200 | 1 | |a Analysis of Thermal-Induced Microstructural Changes in Nanoscale Zr/Nb Metal Layers after Proton Irradiation |f A. D. Lomygin, D. G. Krotkevich, R. S. Laptev [et al.] | |
| 203 | |a Текст |b визуальный |c электронный | ||
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| 300 | |a Title screen | ||
| 320 | |a References: 42 tit | ||
| 330 | |a The effect of annealing on the microstructure, defect structure, and mechanical properties of nanoscale metal systems consisting of alternating layers of Zr and Nb is considered. The effect of annealing was studied on coatings pre-irradiated with protons. Nanoscale Zr/Nb metal layers were prepared using the magnetron sputtering method, each layer was 50 nm thick, and the total thickness of coatings was about 1 μm. Using electron microscopy and glow discharge optical emission spectrometry, it was shown that the multilayer structure was preserved after both irradiation and annealing of irradiated Zr/Nb samples. After annealing at 300°C, a decrease in hydrogen luminescence intensity and proton redistribution were observed. Using X-ray phase analysis, it was shown that at an annealing temperature of 200°C, the interplanar distances for Zr and Nb decreased. At an annealing temperature of 300°C, a sharp increase in the interplanar distance in Zr layers and a slight decrease in the interplanar distance in Nb layers were detected. Layer-by-layer analysis of defects in nanoscale metal layers using variable-energy positron beam and Doppler broadening spectroscopy showed that increasing the annealing temperature stimulated the migration and annihilation of defects at interfaces. Regions of reduced electron density at the interfaces on the zirconium side remain the predominant positron capture centers | ||
| 336 | |a Текстовый файл | ||
| 371 | 0 | |a AM_Agreement | |
| 461 | 1 | |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques |c New York |n Springer Science+Business Media LLC. | |
| 463 | 1 | |t Vol. 18 |v P. 1482-1489 |d 2024 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a nanoscale metal layers | |
| 610 | 1 | |a incoherent interfaces | |
| 610 | 1 | |a gas reaction controller | |
| 610 | 1 | |a magnetron sputtering | |
| 610 | 1 | |a glow discharge optical emission spectrometry | |
| 610 | 1 | |a positron annihilation spectroscopy | |
| 610 | 1 | |a Doppler broadening spectroscopy | |
| 610 | 1 | |a X-ray diffraction analysis | |
| 610 | 1 | |a transmission electron microscopy | |
| 701 | 1 | |a Lomygin |b A. D. |c physicist |c Head of Laboratory, Tomsk Polytechnic University |f 1997- |g Anton Dmitrievich |9 21942 | |
| 701 | 1 | |a Krotkevich |b D. G. |c physicist |c engineer of Tomsk Polytechnic University |f 1990- |g Dmitry Georgievich |9 22434 | |
| 701 | 1 | |a Laptev |b R. S. |c physicist, specialist in the field of non-destructive testing |c Associate Professor of Tomsk Polytechnic University, Doctor of Technical Sciences |f 1987- |g Roman Sergeevich |y Tomsk |9 15956 | |
| 701 | 1 | |a Stepanova |b E. N. |c physicist |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences |f 1981- |g Ekaterina Nikolaevna |9 18329 | |
| 701 | 1 | |a Sidorin |b A. A. |g Aleksey Anatoljevich | |
| 701 | 1 | |a Orlov |b O. S. |g Oleg Sergeevich | |
| 801 | 0 | |a RU |b 63413507 |c 20250410 | |
| 850 | |a 63413507 | ||
| 856 | 4 | |u https://doi.org/10.1134/S102745102470143X |z https://doi.org/10.1134/S102745102470143X | |
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