Effect of Annealing on the Defect Structure, Desorption Properties, and Structural-Phase State in Nanoscale Multilayer Zr/Nb Structures after Hydrogenation; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 17
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.— .— New York: Springer Science+Business Media LLC. Vol. 17.— 2025.— P. 245-252 |
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| Outros Autores: | , , , , , |
| Resumo: | Title screen The effect of annealing after hydrogenation on the defect structure, desorption properties, and structural-phase state of nanoscale multilayer Zr/Nb systems has been studied. Nanoscale multilayer structures based on Zr/Nb were fabricated using a magnetron sputtering system with an individual layer thickness of 50 nm. To analyze changes in the defect structure, one of the techniques of positron annihilation spectroscopy was used, Doppler broadening spectroscopy with a positron beam of variable energy for layer-by-layer positron implantation in Zr/Nb. The depth distribution of elements before and after hydrogenation was studied using glow discharge optical emission spectrometry. Analysis of changes in the structural-phase state was carried out using X-ray diffraction analysis. Thermal desorption spectroscopy was used to study the desorption of hydrogen from Zr/Nb, and the activation energy of hydrogen release was calculated by constructing Arrhenius plots. The forms of the Arrhenius plots differ from their usual form, which is associated with a nontypical distribution of hydrogen in Zr/Nb Текстовый файл AM_Agreement |
| Idioma: | inglês |
| Publicado em: |
2025
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| Assuntos: | |
| Acesso em linha: | https://doi.org/10.1134/S1027451024702136 |
| Formato: | Recurso Eletrônico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=679534 |
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| 200 | 1 | |a Effect of Annealing on the Defect Structure, Desorption Properties, and Structural-Phase State in Nanoscale Multilayer Zr/Nb Structures after Hydrogenation |f A. D. Lomygin, D. G. Krotkevich, R. S. Laptev [et al.] | |
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| 300 | |a Title screen | ||
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| 330 | |a The effect of annealing after hydrogenation on the defect structure, desorption properties, and structural-phase state of nanoscale multilayer Zr/Nb systems has been studied. Nanoscale multilayer structures based on Zr/Nb were fabricated using a magnetron sputtering system with an individual layer thickness of 50 nm. To analyze changes in the defect structure, one of the techniques of positron annihilation spectroscopy was used, Doppler broadening spectroscopy with a positron beam of variable energy for layer-by-layer positron implantation in Zr/Nb. The depth distribution of elements before and after hydrogenation was studied using glow discharge optical emission spectrometry. Analysis of changes in the structural-phase state was carried out using X-ray diffraction analysis. Thermal desorption spectroscopy was used to study the desorption of hydrogen from Zr/Nb, and the activation energy of hydrogen release was calculated by constructing Arrhenius plots. The forms of the Arrhenius plots differ from their usual form, which is associated with a nontypical distribution of hydrogen in Zr/Nb | ||
| 336 | |a Текстовый файл | ||
| 371 | 0 | |a AM_Agreement | |
| 461 | 1 | |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques |c New York |n Springer Science+Business Media LLC. | |
| 463 | 1 | |t Vol. 17 |v P. 245-252 |d 2025 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a nanoscale multilayer structures | |
| 610 | 1 | |a incoherent interfaces | |
| 610 | 1 | |a hydrogenation | |
| 610 | 1 | |a gas reaction controller | |
| 610 | 1 | |a reduction annealing | |
| 610 | 1 | |a positron annihilation spectroscopy | |
| 610 | 1 | |a Doppler broadening spectroscopy | |
| 610 | 1 | |a glow discharge optical emission spectrometry | |
| 610 | 1 | |a X-ray diffraction analysis | |
| 610 | 1 | |a thermodesorption analysis | |
| 701 | 1 | |a Lomygin |b A. D. |c physicist |c Head of Laboratory, Tomsk Polytechnic University |f 1997- |g Anton Dmitrievich |9 21942 | |
| 701 | 1 | |a Krotkevich |b D. G. |c physicist |c engineer of Tomsk Polytechnic University |f 1990- |g Dmitry Georgievich |9 22434 | |
| 701 | 1 | |a Laptev |b R. S. |c physicist, specialist in the field of non-destructive testing |c Associate Professor of Tomsk Polytechnic University, Doctor of Technical Sciences |f 1987- |g Roman Sergeevich |y Tomsk |9 15956 | |
| 701 | 0 | |a Wang Zhihuai | |
| 701 | 1 | |a Sidorin |b A. A. |g Aleksey Anatoljevich | |
| 701 | 1 | |a Orlov |b O. S. |g Oleg Sergeevich | |
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