Measurement of the electron beam profile by the multi-angle scanning method; Young Scientists and Specialists (AYSS-2024)

Xehetasun bibliografikoak
Parent link:	Young Scientists and Specialists (AYSS-2024).— 2024.— P. 1688
Beste egile batzuk:	Bulavskaya A. A. Angelina Aleksandrovna, Baldin A. A. Anton Aleksandrovich, Bushmina E. A. Elizaveta Alekseevna, Miloichikova I. A. Irina Alekseevna, Timoshenko K. D. Konstantin Dmitrievich, Karataev P. V. Pavel Vladimirovich, Mitrofanov S. Semen, Alekseev S. V. Sergei, Stuchebrov S. G. Sergey Gennadevich
Gaia:	In the context of modern accelerator technology, it is essential to guarantee the specified characteristics of the extracted electron beam. In addition to the information regarding the energy and intensity of the beam, it is crucial to ascertain its spatial and angular distribution Текстовый файл
Hizkuntza:	ingelesa
Argitaratua:	2024
Gaiak:	электронный ресурс труды учёных ТПУ
Sarrera elektronikoa:	https://indico.jinr.ru/event/4343/contributions/28874/
Formatua:	Baliabide elektronikoa Liburu kapitulua
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=678601

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