Measurement of the electron beam profile by the multi-angle scanning method; Young Scientists and Specialists (AYSS-2024)

Λεπτομέρειες βιβλιογραφικής εγγραφής
Parent link:Young Scientists and Specialists (AYSS-2024).— 2024.— P. 1688
Άλλοι συγγραφείς: Bulavskaya A. A. Angelina Aleksandrovna, Baldin A. A. Anton Aleksandrovich, Bushmina E. A. Elizaveta Alekseevna, Miloichikova I. A. Irina Alekseevna, Timoshenko K. D. Konstantin Dmitrievich, Karataev P. V. Pavel Vladimirovich, Mitrofanov S. Semen, Alekseev S. V. Sergei, Stuchebrov S. G. Sergey Gennadevich
Περίληψη:In the context of modern accelerator technology, it is essential to guarantee the specified characteristics of the extracted electron beam. In addition to the information regarding the energy and intensity of the beam, it is crucial to ascertain its spatial and angular distribution
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Γλώσσα:Αγγλικά
Έκδοση: 2024
Θέματα:
Διαθέσιμο Online:https://indico.jinr.ru/event/4343/contributions/28874/
Μορφή: Ηλεκτρονική πηγή Κεφάλαιο βιβλίου
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=678601