Layered Composite Hydrogenated Films of Zirconium and Niobium: Production Method and Testing Using Thermo EMF (Thermoelectric Method); Russian Journal of Nondestructive Testing; Vol. 60, iss. 8
| Parent link: | Russian Journal of Nondestructive Testing.— .— New York: Springer Science+Business Media LLC. Vol. 60, iss. 8.— 2024.— P. 21-31 |
|---|---|
| Hlavní autor: | |
| Další autoři: | , |
| Shrnutí: | Title screen Layered materials incorporating hydrogen were obtained using Nb/Zr films with varying numbers of layers from 50 to 100. The films were deposited on a silicon substrate using a vacuum magnetron sputtering method on a dedicated setup. The film thickness varied from 10 to 50 nm. The resulting material was hydrogenated with protons on a TPU electrostatic generator with an energy of up to 1.2 MeV. The deposition modes for nanoscale metallic multilayer Zr/Nb systems were determined: for a Zr target the specific power of the sputtering system was 37.9 W/cm2, and for a Nb target it was 26.4 W/cm2. A coating with clear boundaries between individual layers of zirconium and niobium was obtained. It was shown that the optimal conditions for studying nanoscale Zr/Nb layers are a pressure of 700 Pa, a power of 40 W, a frequency of 2 kHz, and a plasma filling factor of 12.5% for coatings with individual layer thicknesses of 100 nm. For coatings with layer thicknesses from 10 to 50 nm, the optimal conditions are a pressure of 650 Pa, a power of 40 W, and a frequency of 1 kHz. The thermo EMF method (GOST (State Standard) 25315–82) was used for testing. It was found out that after proton irradiation, an intensive accumulation of hydrogen atoms occurs near the interfaces; it reduces the structure defectiveness and entails a change in the thermo EMF up to the inversion of its sign. The hydrogen distribution is predominantly bimodal, with local maxima in hydrogen concentration observed at the Nb/Zr interfaces, while accumulation at the Zr/Nb interface is considerably lower. Hydrogen localization near interfaces primarily occurs around zirconium Текстовый файл AM_Agreement |
| Jazyk: | angličtina |
| Vydáno: |
2024
|
| Témata: | |
| On-line přístup: | https://doi.org/10.1134/S106183092470075X |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=678251 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 678251 | ||
| 005 | 20251028071621.0 | ||
| 090 | |a 678251 | ||
| 100 | |a 20250120a2024 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a US | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i |b e | |
| 182 | 0 | |a b | |
| 183 | 0 | |a cr |2 RDAcarrier | |
| 200 | 1 | |a Layered Composite Hydrogenated Films of Zirconium and Niobium: Production Method and Testing Using Thermo EMF (Thermoelectric Method) |f V. V. Larionov, R. S. Laptev, A. M. Lider | |
| 203 | |a Текст |c электронный |b визуальный | ||
| 283 | |a online_resource |2 RDAcarrier | ||
| 300 | |a Title screen | ||
| 320 | |a References: 43 tit | ||
| 330 | |a Layered materials incorporating hydrogen were obtained using Nb/Zr films with varying numbers of layers from 50 to 100. The films were deposited on a silicon substrate using a vacuum magnetron sputtering method on a dedicated setup. The film thickness varied from 10 to 50 nm. The resulting material was hydrogenated with protons on a TPU electrostatic generator with an energy of up to 1.2 MeV. The deposition modes for nanoscale metallic multilayer Zr/Nb systems were determined: for a Zr target the specific power of the sputtering system was 37.9 W/cm2, and for a Nb target it was 26.4 W/cm2. A coating with clear boundaries between individual layers of zirconium and niobium was obtained. It was shown that the optimal conditions for studying nanoscale Zr/Nb layers are a pressure of 700 Pa, a power of 40 W, a frequency of 2 kHz, and a plasma filling factor of 12.5% for coatings with individual layer thicknesses of 100 nm. For coatings with layer thicknesses from 10 to 50 nm, the optimal conditions are a pressure of 650 Pa, a power of 40 W, and a frequency of 1 kHz. The thermo EMF method (GOST (State Standard) 25315–82) was used for testing. It was found out that after proton irradiation, an intensive accumulation of hydrogen atoms occurs near the interfaces; it reduces the structure defectiveness and entails a change in the thermo EMF up to the inversion of its sign. The hydrogen distribution is predominantly bimodal, with local maxima in hydrogen concentration observed at the Nb/Zr interfaces, while accumulation at the Zr/Nb interface is considerably lower. Hydrogen localization near interfaces primarily occurs around zirconium | ||
| 336 | |a Текстовый файл | ||
| 371 | 0 | |a AM_Agreement | |
| 461 | 1 | |t Russian Journal of Nondestructive Testing |c New York |n Springer Science+Business Media LLC. | |
| 463 | 1 | |t Vol. 60, iss. 8 |v P. 21-31 |d 2024 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a films | |
| 610 | 1 | |a proton hydrogenation | |
| 610 | 1 | |a zirconium | |
| 610 | 1 | |a niobium | |
| 610 | 1 | |a testing | |
| 610 | 1 | |a thermo EMF | |
| 700 | 1 | |a Larionov |b V. V. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of Pedagogical Sciences |f 1945- |g Vitaliy Vasilyevich |9 14653 | |
| 701 | 1 | |a Laptev |b R. S. |c physicist, specialist in the field of non-destructive testing |c Associate Professor of Tomsk Polytechnic University, Doctor of Technical Sciences |f 1987- |g Roman Sergeevich |y Tomsk |9 15956 | |
| 701 | 1 | |a Lider |b A. M. |c Physicist |c Professor of Tomsk Polytechnic University, Doctor of Technical Sciences |f 1976-2025 |g Andrey Markovich |y Tomsk |9 14743 | |
| 801 | 0 | |a RU |b 63413507 |c 20250120 |g RCR | |
| 856 | 4 | |u https://doi.org/10.1134/S106183092470075X |z https://doi.org/10.1134/S106183092470075X | |
| 942 | |c CF | ||