APA (7th ed.) Citation

Томский политехнический университет, Malozemov B. V. Boris Vitaljevich, Martyushev N. V. Nikita Vladimirovich, Bryukhanova N. N. Nataljya Nikolaevna, Kondratjev V. V. Viktor Viktorovich, Kononenko R, V. R. V., . . . Karlina Yu. I. Yuliya Igorevna. (2024). Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits; Micromachines; Vol. 15, iss. 5. 2024. https://doi.org/10.3390/mi15050561

Chicago Style (17th ed.) Citation

Томский политехнический университет, Malozemov B. V. Boris Vitaljevich, Martyushev N. V. Nikita Vladimirovich, Bryukhanova N. N. Nataljya Nikolaevna, Kondratjev V. V. Viktor Viktorovich, V. Roman Vladimirovich Kononenko R, Pavlov P. P. Pavel Pavlovich, Romanova V. V. Viktoriya Viktorovna, and Karlina Yu. I. Yuliya Igorevna. Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits; Micromachines; Vol. 15, Iss. 5. 2024, 2024. https://doi.org/10.3390/mi15050561.

MLA (9th ed.) Citation

Томский политехнический университет, et al. Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits; Micromachines; Vol. 15, Iss. 5. 2024, 2024. https://doi.org/10.3390/mi15050561.