National Research Tomsk Polytechnic University, Malozemov B. V. Boris Vitaljevich, Martyushev N. V. Nikita Vladimirovich, Bryukhanova N. N. Nataljya Nikolaevna, Kondratjev V. V. Viktor Viktorovich, Kononenko R, V. R. V., . . . Karlina Yu. I. Yuliya Igorevna. (2024). Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. 2024. https://doi.org/10.3390/mi15050561
Citazione stile Chigago Style (17a edizione)National Research Tomsk Polytechnic University, Malozemov B. V. Boris Vitaljevich, Martyushev N. V. Nikita Vladimirovich, Bryukhanova N. N. Nataljya Nikolaevna, Kondratjev V. V. Viktor Viktorovich, V. Roman Vladimirovich Kononenko R, Pavlov P. P. Pavel Pavlovich, Romanova V. V. Viktoriya Viktorovna, e Karlina Yu. I. Yuliya Igorevna. Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. 2024, 2024. https://doi.org/10.3390/mi15050561.
Citatione MLA (9a ed.)National Research Tomsk Polytechnic University, et al. Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits. 2024, 2024. https://doi.org/10.3390/mi15050561.