Analysis of high-resolution spectra of SiF4 combination bands

Analysis of high-resolution spectra of SiF4 combination bands

Bibliographic Details
Parent link:Journal of Molecular Spectroscopy.— .— Amsterdam: Elsevier Science Publishing Company Inc.
Vol. 391.— 2023.— Article number 111738, 12 p.
Main Author: Merkulova M. A. Maria Andreevna
Corporate Author: National Research Tomsk Polytechnic University (570)
Other Authors: Boudon V. Vincent, Manceron L. Laurent
Summary:Title screen
The infrared spectra of the silicon tetrafluoride molecule (SiF4) recorded on the AILES Beamline of the SOLEIL Synchrotron facility, have been studied in the range where the combination bands ν1+ν3, ν1+ν4, ν2+ν3 and ν2+ν4 are located. For each band, between 1100 and more than 2300 lines have been assigned and fitted with the effective Hamiltonian model for J values up to 55 (up to 82 for ν1+ν3). The obtained set of spectroscopic parameters allows one to reproduce experimentally obtained line positions with a root mean square deviation better than drms=0.863×10−3 cm−1
Текстовый файл
AM_Agreement
Language:English
Published: 2023
Subjects:
электронный ресурс
труды учёных ТПУ
high-resolution molecular spectroscopy
SiF4
determination of spectroscopic parameters
spherical top molecule
Online Access:https://doi.org/10.1016/j.jms.2023.111738
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=675758

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