Analysis of high-resolution spectra of SiF4 combination bands; Journal of Molecular Spectroscopy; Vol. 391
| Parent link: | Journal of Molecular Spectroscopy.— .— Amsterdam: Elsevier Science Publishing Company Inc. Vol. 391.— 2023.— Article number 111738, 12 p. |
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| Συγγραφή απο Οργανισμό/Αρχή: | |
| Άλλοι συγγραφείς: | , |
| Περίληψη: | Title screen The infrared spectra of the silicon tetrafluoride molecule (SiF4) recorded on the AILES Beamline of the SOLEIL Synchrotron facility, have been studied in the range where the combination bands ν1+ν3, ν1+ν4, ν2+ν3 and ν2+ν4 are located. For each band, between 1100 and more than 2300 lines have been assigned and fitted with the effective Hamiltonian model for J values up to 55 (up to 82 for ν1+ν3). The obtained set of spectroscopic parameters allows one to reproduce experimentally obtained line positions with a root mean square deviation better than drms=0.863×10−3 cm−1 Текстовый файл AM_Agreement |
| Γλώσσα: | Αγγλικά |
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2023
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| Διαθέσιμο Online: | https://doi.org/10.1016/j.jms.2023.111738 |
| Μορφή: | Ηλεκτρονική πηγή Κεφάλαιο βιβλίου |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=675758 |
| Περίληψη: | Title screen The infrared spectra of the silicon tetrafluoride molecule (SiF4) recorded on the AILES Beamline of the SOLEIL Synchrotron facility, have been studied in the range where the combination bands ν1+ν3, ν1+ν4, ν2+ν3 and ν2+ν4 are located. For each band, between 1100 and more than 2300 lines have been assigned and fitted with the effective Hamiltonian model for J values up to 55 (up to 82 for ν1+ν3). The obtained set of spectroscopic parameters allows one to reproduce experimentally obtained line positions with a root mean square deviation better than drms=0.863×10−3 cm−1 Текстовый файл AM_Agreement |
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| DOI: | 10.1016/j.jms.2023.111738 |