Томский политехнический университет, Ding Yinuo, Jue Hu, Sfarra S. Stefano, Pivarciova E. Elena, Vavilov V. P. Vladimir Platonovich, . . . Zhang Hai. (2024). Fusion of infrared and terahertz imaging for non-invasive inspection of marqueteries coupled with finite element analyses; Infrared Physics and Technology; Vol. 140. 2024. https://doi.org/10.1016/j.infrared.2024.105379
Chicago Style (17th ed.) CitationТомский политехнический университет, Ding Yinuo, Jue Hu, Sfarra S. Stefano, Pivarciova E. Elena, Vavilov V. P. Vladimir Platonovich, Maldague X. Xavier, and Zhang Hai. Fusion of Infrared and Terahertz Imaging for Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses; Infrared Physics and Technology; Vol. 140. 2024, 2024. https://doi.org/10.1016/j.infrared.2024.105379.
MLA (9th ed.) CitationТомский политехнический университет, et al. Fusion of Infrared and Terahertz Imaging for Non-invasive Inspection of Marqueteries Coupled with Finite Element Analyses; Infrared Physics and Technology; Vol. 140. 2024, 2024. https://doi.org/10.1016/j.infrared.2024.105379.