Digital image correlation (DIC): Decorrelation problem due to large strains; Перспективы развития фундаментальных наук; Т. 7 : IT-технологии и электроника
| Parent link: | Курзина, И. А. (химик ; 1972-). Перспективы развития фундаментальных наук=Prospects of Fundamental Sciences Development: сборник научных трудов XXI Международной конференции студентов, аспирантов и молодых ученых, г. Томск, 23-26 апреля 2024 г..— .— Томск: Изд-во ТПУ Т. 7 : IT-технологии и электроника.— 2024.— С. 6-8 |
|---|---|
| Autor principal: | |
| Altres autors: | |
| Sumari: | Title screen The digital image correlation (DIC) method was used to calculate the strain field of a sample experiencing large deformations during a tensile test. Two codes were used for the calculation (the iCorrelate-vision 2D code and GOM software). Three calculation options were applied; the spatial correlation of images was evaluated, as was the incremental correlation of successive images. A comparison of the results is given in the article. Mainly, the decorrelation problem arises due to the poor matching between the correlated subsets in the case of large strains. Poor matching can result from large changes in the speckle pattern. Updating the reference image can minimize these changes. When using a fixed reference image, the correlation algorithm will not be able to track significant changes in the deformed target subset, which will lead to a failure in the matching between the reference and deformed subsets, even when using correlation algorithms with very high efficiency Текстовый файл |
| Idioma: | anglès |
| Publicat: |
2024
|
| Matèries: | |
| Accés en línia: | http://earchive.tpu.ru/handle/11683/80460 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=674284 |
MARC
| LEADER | 00000naa2a2200000 4500 | ||
|---|---|---|---|
| 001 | 674284 | ||
| 005 | 20251225104455.0 | ||
| 090 | |a 674284 | ||
| 100 | |a 20240829d2024 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a RU | ||
| 135 | |a drcn ---uucaa | ||
| 200 | 1 | |a Digital image correlation (DIC): Decorrelation problem due to large strains |f A. F. Abouellail |g scientific supervisor M. V. Trigub ; Tomsk Polytechnic University | |
| 300 | |a Title screen | ||
| 320 | |a References: 4 tit. | ||
| 330 | |a The digital image correlation (DIC) method was used to calculate the strain field of a sample experiencing large deformations during a tensile test. Two codes were used for the calculation (the iCorrelate-vision 2D code and GOM software). Three calculation options were applied; the spatial correlation of images was evaluated, as was the incremental correlation of successive images. A comparison of the results is given in the article. Mainly, the decorrelation problem arises due to the poor matching between the correlated subsets in the case of large strains. Poor matching can result from large changes in the speckle pattern. Updating the reference image can minimize these changes. When using a fixed reference image, the correlation algorithm will not be able to track significant changes in the deformed target subset, which will lead to a failure in the matching between the reference and deformed subsets, even when using correlation algorithms with very high efficiency | ||
| 336 | |a Текстовый файл | ||
| 461 | 1 | |0 674010 |t Перспективы развития фундаментальных наук |l Prospects of Fundamental Sciences Development |o сборник научных трудов XXI Международной конференции студентов, аспирантов и молодых ученых, г. Томск, 23-26 апреля 2024 г. |9 674010 |a Курзина, И. А. (химик ; 1972-) |c Томск |n Изд-во ТПУ | |
| 463 | 1 | |0 674014 |t Т. 7 : IT-технологии и электроника |v С. 6-8 |d 2024 |9 674014 |u conference_tpu-2024-C21_V7.pdf |l Vol. 7 : IT-technologies and Electronics | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a Digital Image Correlation | |
| 610 | 1 | |a large strain | |
| 610 | 1 | |a decorrelation | |
| 610 | 1 | |a optical inspection of surfaces | |
| 700 | 1 | |a Abouellail |b A. F. A. |g Abdelmeguid Fathy Ahmed |f 1993- |c physicist |c Senior Lecturer of Tomsk Polytechnic University |y Tomsk |9 88989 | |
| 702 | 1 | |a Trigub |b M. V. |c specialist in the field of non-destructive testing |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1987- |g Maksim Viktorovich |4 727 | |
| 801 | 0 | |a RU |b 63413507 |c 20240829 |g RCR | |
| 856 | 4 | |z http://earchive.tpu.ru/handle/11683/80460 |u http://earchive.tpu.ru/handle/11683/80460 | |
| 942 | |c CF | ||