New microfocus source based on a betatron for hard X-rays imaging; Journal of Instrumentation; Vol. 19, May 2024, iss. 5 : The XIV International Symposium on Radiation from Relativistic Electrons in Periodic Structures merged with the VIII International Conference on Electron, Positron, Neutron and X-ray Scattering under External Influences, RREPS-23 & Meghri-23, 18-22 September, 2023 Tsaghkadzor, Republic of Armenia

New microfocus source based on a betatron for hard X-rays imaging; Journal of Instrumentation; Vol. 19, May 2024, iss. 5 : The XIV International Symposium on Radiation from Relativistic Electrons in Periodic Structures merged with the VIII International Conference on Electron, Positron, Neutron and X-ray Scattering under External Influences, RREPS-23 & Meghri-23, 18-22 September, 2023 Tsaghkadzor, Republic of Armenia

Sonraí bibleagrafaíochta
Parent link:	Journal of Instrumentation.— .— Bristol: IOP Publishing Ltd..— 1748-0221 Vol. 19, May 2024, iss. 5 : The XIV International Symposium on Radiation from Relativistic Electrons in Periodic Structures merged with the VIII International Conference on Electron, Positron, Neutron and X-ray Scattering under External Influences, RREPS-23 & Meghri-23, 18-22 September, 2023 Tsaghkadzor, Republic of Armenia.— 2024.— Article number C05018, 9 p.
Príomhchruthaitheoir:	Rychkov M. M. Maksim Mikhailovich
Rannpháirtithe:	Kaplin V. V. Valery Viktorovich, Smolyanskiy V. A. Vladimir Aleksandrovich
Achoimre:	Title screen The paper reports experimental results demonstrating some properties of microfocus radiation generated in narrow internal silicon (Si) and tantalum (Ta) targets of the B-18 betatron with electron energy of 18 MeV. The targets were 50-μm- and 8-μm-thick Si crystals and a 13-μm-thick Ta foil oriented with a goniometer along the inner electron beam. The results showed strong dependence of the radiation beam shape on the orientation of the target relative to the electron beam, and on the target material. The resolution and contrast dependences of the Duplex IQI standard wire pair images on the position of the pairs in the radiation beam and on the target material are shown. The obtained results revealed the role of absorption and refraction of radiation in generation of magnified images of plastic and metal plate edges. Radiation generated in the Ta target showed high detection sensitivity for narrow gaps and thin inclusions in steel thickness Текстовый файл AM_Agreement
Teanga:	Béarla
Foilsithe / Cruthaithe:	2024
Ábhair:	электронный ресурс труды учёных ТПУ микрофокусное излучение электронные пучки поглощение преломление
Rochtain ar líne:	https://doi.org/10.1088/1748-0221/19/05/C05018
Formáid:	Leictreonach Caibidil leabhair
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=673397

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