Rychkov M. M. Maksim Mikhailovich, Kaplin V. V. Valery Viktorovich, & Smolyanskiy V. A. Vladimir Aleksandrovich. (2024). New microfocus source based on a betatron for hard X-rays imaging. 2024. https://doi.org/10.1088/1748-0221/19/05/C05018
Chicago Style (17th ed.) CitationRychkov M. M. Maksim Mikhailovich, Kaplin V. V. Valery Viktorovich, and Smolyanskiy V. A. Vladimir Aleksandrovich. New Microfocus Source Based on a Betatron for Hard X-rays Imaging. 2024, 2024. https://doi.org/10.1088/1748-0221/19/05/C05018.
MLA (9th ed.) CitationRychkov M. M. Maksim Mikhailovich, et al. New Microfocus Source Based on a Betatron for Hard X-rays Imaging. 2024, 2024. https://doi.org/10.1088/1748-0221/19/05/C05018.
Warning: These citations may not always be 100% accurate.