A novel reference-free technique for processing one-sided thermal NDT results in the time domain

A novel reference-free technique for processing one-sided thermal NDT results in the time domain

Detaylı Bibliyografya
Parent link:	NDT and E International.— .— Amsterdam: Elsevier Science Publishing Company Inc. Vol. 143.— 2024.— Article number 103032, [P. 1-8]
Diğer Yazarlar:	Vavilov V. P. Vladimir Platonovich, Chulkov A. O. Arseniy Olegovich, Shiryaev V. V. Vladimir Vasilyevich, Kladov D. Dmitry
Özet:	In this study, simple analytical and numerical solutions were used to introduce a novel technique of processing thermal nondestructive testing (TNDT) results using a one-sided test procedure to determine material apparent diffusivity and represent TNDT results in the time domain without identifying non-defect areas. The technique is based on establishing dimensionless levels in the temperature decay functions that describe the cooling profile of a test sample after pulsed heating. The times when such levels cross the front-surface response curves may serve as specific heat transit times and may reduce the temperature-related noise. The corresponding level images are not associated with any reference point and allow determining apparent diffusivity thus providing more contrast representation of defect indications than raw infrared images. Текстовый файл
Dil:	İngilizce
Baskı/Yayın Bilgisi:	2024
Konular:	thermal nondestructive testing time-domain treatment composite one-sided test procedure level images труды учёных ТПУ электронный ресурс
Online Erişim:	https://doi.org/10.1016/j.ndteint.2023.103032
Materyal Türü:	Elektronik Kitap Bölümü
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=672814

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