A method of real-time monitoring beam output stability of intense pulsed ion beam; Acta Physica Sinica; Vol. 72, iss. 17
| Parent link: | Acta Physica Sinica.— .— Beijing: Chinese Physical Society Vol. 72, iss. 17.— 2023.— Article number 175205, 6 p. |
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| Autor corporatiu: | |
| Altres autors: | , , , , |
| Sumari: | Title screen Intense pulsed ion beam (IPIB) technology has made remarkable progress in surface modification, mixing, polishing, film deposition, and nano powder synthesis in recent years. However, the surface properties of materials under IPIB irradiation are highly sensitive to beam intensity variations. Deviations from acceptable parameter range can change the surface characteristics and increase prevalence of defects. Consequently, the real-time online monitoring of beam stability during irradiation experiments and promptly identifying of pulses exhibiting significant parameter jitter are of significance in accurately analyzing results and optimizing surface modification. This study presents a fast-response pulse X-ray diagnostic system by employing EJ-200 plastic scintillator, 9266FLB photomultiplier tube, and Tektronic TDS 2024 four-channel oscilloscope. Single particle test demonstrates that the system achieves a time resolution of 6 ns, meeting the requirements for temporal response to detecting pulse X-ray signals with a half-width of ~80 ns. By adjusting the insulation magnetic field strength of the ion diode, the IPIB output level is regulated. The diagnostic system successfully captures X-rays emitted by the external magnetic insulated ion diode operating at different output levels. Simultaneously, the ion beam energy density is measured by using an infrared camera. To mitigate diagnostic errors stemming from target ablation, the maximum energy density is controlled to be below 1.32 J/cm2. Analysis results establish a positive correlation between X-ray intensity and ion beam energy density. This relationship arises from the influence of the insulating magnetic field adjustment on the diode's operating voltage, which subsequently affects the bremsstrahlung radiant intensity and ion beam emission intensity. This correlation offers the potential for the real-time monitoring of IPIB beam output stability by utilizing X-ray signals. To further corroborate the synchronized changes in pulse X-ray intensity and ion beam intensity, Faraday cup is employed as an alternative to infrared imaging method for measuring ion current density. Results demonstrate that the amplitude of the X-ray signal changes synchronously with fluctuations of ion current density. It is worth noting that when the output intensity of ion beam deviates significantly (more than 10% of the preset value), the diagnostic system will respond quickly. These findings validate the efficacy of the proposed non-interceptive diagnostic method of real-time monitoring the intense pulsed ion beam output stability Текстовый файл |
| Idioma: | anglès |
| Publicat: |
2023
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| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.7498/aps.72.20230854 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=672547 |
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| 200 | 1 | |a A method of real-time monitoring beam output stability of intense pulsed ion beam |f Xu Mo-Fei, Yu Xiang, Zhang Shi-Jian [et al.] | |
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| 330 | |a Intense pulsed ion beam (IPIB) technology has made remarkable progress in surface modification, mixing, polishing, film deposition, and nano powder synthesis in recent years. However, the surface properties of materials under IPIB irradiation are highly sensitive to beam intensity variations. Deviations from acceptable parameter range can change the surface characteristics and increase prevalence of defects. Consequently, the real-time online monitoring of beam stability during irradiation experiments and promptly identifying of pulses exhibiting significant parameter jitter are of significance in accurately analyzing results and optimizing surface modification. This study presents a fast-response pulse X-ray diagnostic system by employing EJ-200 plastic scintillator, 9266FLB photomultiplier tube, and Tektronic TDS 2024 four-channel oscilloscope. Single particle test demonstrates that the system achieves a time resolution of 6 ns, meeting the requirements for temporal response to detecting pulse X-ray signals with a half-width of ~80 ns. By adjusting the insulation magnetic field strength of the ion diode, the IPIB output level is regulated. The diagnostic system successfully captures X-rays emitted by the external magnetic insulated ion diode operating at different output levels. Simultaneously, the ion beam energy density is measured by using an infrared camera. To mitigate diagnostic errors stemming from target ablation, the maximum energy density is controlled to be below 1.32 J/cm2. Analysis results establish a positive correlation between X-ray intensity and ion beam energy density. This relationship arises from the influence of the insulating magnetic field adjustment on the diode's operating voltage, which subsequently affects the bremsstrahlung radiant intensity and ion beam emission intensity. This correlation offers the potential for the real-time monitoring of IPIB beam output stability by utilizing X-ray signals. To further corroborate the synchronized changes in pulse X-ray intensity and ion beam intensity, Faraday cup is employed as an alternative to infrared imaging method for measuring ion current density. Results demonstrate that the amplitude of the X-ray signal changes synchronously with fluctuations of ion current density. It is worth noting that when the output intensity of ion beam deviates significantly (more than 10% of the preset value), the diagnostic system will respond quickly. These findings validate the efficacy of the proposed non-interceptive diagnostic method of real-time monitoring the intense pulsed ion beam output stability | ||
| 336 | |a Текстовый файл | ||
| 461 | 1 | |t Acta Physica Sinica |c Beijing |n Chinese Physical Society | |
| 463 | 1 | |t Vol. 72, iss. 17 |v Article number 175205, 6 p. |d 2023 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a intense pulsed ion beam | |
| 610 | 1 | |a beam output stability | |
| 610 | 1 | |a real-time monitoring | |
| 610 | 1 | |a pulsed X-ray diagnostic system | |
| 701 | 0 | |a Xu Mo-Fei | |
| 701 | 0 | |a Yu Xiang | |
| 701 | 0 | |a Zhang Shi-Jian | |
| 701 | 1 | |a Remnev (Remnyov) |b G. E. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1948- |g Gennady Efimovich |9 15661 | |
| 701 | 0 | |a Le Xiao-Yun | |
| 712 | 0 | 2 | |a National Research Tomsk Polytechnic University |c (2009- ) |9 27197 |
| 801 | 0 | |a RU |b 63413507 |c 20240517 | |
| 850 | |a 63413507 | ||
| 856 | 4 | |u http://dx.doi.org/10.7498/aps.72.20230854 |z http://dx.doi.org/10.7498/aps.72.20230854 | |
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