Algorithm for Optimizing the Parameters of Sandwich X-ray Detectors

Bibliographic Details
Parent link:Russian Journal of Nondestructive Testing=Дефектоскопия.— .— New York: Springer Science+Business Media LLC.
Vol. 59, iss. 3.— 2023.— P. 359-373
Main Author: Udod V. A. Viktor Anatolievich
Corporate Author: National Research Tomsk Polytechnic University
Other Authors: Osipov S. P. Sergey Pavlovich, Nazarenko S. Yu. Svetlana Yurjevna
Summary:Title screen
We describe an algorithm for optimizing the parameters of sandwich X-ray detectors in relation to the recognition of materials by the dual energy method. The application of the algorithm is illustrated by a concrete example in which we obtain the thicknesses of the first detector and the intermediate filter (that are part of a sandwich detector) that are optimal for detecting explosives for the given materials of the first detector (CsI) and the intermediate filter (Cu).
Текстовый файл
AM_Agreement
Language:English
Published: 2023
Subjects:
Online Access:https://doi.org/10.1134/S1061830923700298
Статья на русском языке
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=672185

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330 |a We describe an algorithm for optimizing the parameters of sandwich X-ray detectors in relation to the recognition of materials by the dual energy method. The application of the algorithm is illustrated by a concrete example in which we obtain the thicknesses of the first detector and the intermediate filter (that are part of a sandwich detector) that are optimal for detecting explosives for the given materials of the first detector (CsI) and the intermediate filter (Cu). 
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463 1 |t Vol. 59, iss. 3  |v P. 359-373  |d 2023 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a X-ray radiation 
610 1 |a algorithm 
610 1 |a optimization 
610 1 |a sandwich detector 
610 1 |a dual energy method 
610 1 |a material recognition 
610 1 |a effective atomic number 
700 1 |a Udod  |b V. A.  |c specialist in the field of non-destructive testing  |c Leading researcher of Tomsk Polytechnic University, Doctor of technical sciences  |f 1959-  |g Viktor Anatolievich  |9 18497 
701 1 |a Osipov  |b S. P.  |c specialist in the field of non-destructive testing  |c Leading researcher of Tomsk Polytechnic University, candidate of technical sciences  |f 1958-  |g Sergey Pavlovich  |9 18373 
701 1 |a Nazarenko  |b S. Yu.  |c Physicist  |c Assistant of the Department of Tomsk Polytechnic University  |f 1990-  |g Svetlana Yurjevna  |9 22801 
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