Interaction of Si Atom with the (001) Surface of TiN, AlN and TaN Compounds; Coatings; Vol. 13, iss. 8

Bibliografski detalji
Parent link:Coatings.— .— Basel: MDPI AG
Vol. 13, iss. 8.— 2024.— Article number 1453, 20 p.
Autor kompanije: National Research Tomsk Polytechnic University
Daljnji autori: Svyatkin L. A. Leonid Aleksandrovich, Ognev S. O. Sergey Olegovich, Syrtanov M. S. Maksim Sergeevich, Koroteev Yu. M. Yuri Mikhailovich
Sažetak:Title screen
Nowadays, the application of multicomponent coatings with multiphase nanocrystalline structure is the most promising direction in the search for wear-resistant protective coatings with a full set of necessary operational properties. Nanocrystalline multicomponent coatings based on the Ti-Al-Ta-Si-N system have a high hardness combined with thermal stability and oxidation resistance. Silicon atoms are weakly soluble in the TiN, Ti1−xAlxN, and TaN crystalline phases of the Ti-Al-Ta-Si-N system and interact preferentially with N atoms, forming the amorphous Si3N4 phase. In this context, it is important to first study the peculiarities of the interaction of Si atoms with the simplest structural units of the Ti-Al-Ta-Si-N system, such as TiN, AlN, and TaN compounds with the NaCl structure. This work is devoted to the study of the interaction of a Si atom with the (001) surface of AlN, TiN, and TaN compounds with the NaCl structure using ab initio calculations. This provides information for a deep understanding of the initial stages of the formation of different crystallites of the considered composite. It was established that the adsorption of silicon on the (001) surface of AlN, TiN, and TaN significantly increases the relaxation of the surface layers and leads to an increase in the corrugation observed on the clean surfaces. The largest corrugation is observed on the surface of the TaN compound. The most energetically favorable adsorption positions of Si atoms were found to be the position of Si above the N atom on the TiN and TaN surfaces and the quadruple coordinated position on the AlN surface. The valence electron density distribution and the crystal orbital Hamiltonian population were studied to identify the type of Si atom bonding with the (001) surface of AlN, TiN, and TaN compounds. It was found that silicon forms predominantly covalent bonds with the nearest metal and nitrogen atoms, except for the quadruple coordinated position on the surface of TiN and TaN, where there is a high degree of ionic bonding of silicon with surface atoms
Текстовый файл
Jezik:engleski
Izdano: 2024
Teme:
Online pristup:http://earchive.tpu.ru/handle/11683/132499
https://doi.org/10.3390/coatings13081453
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=672183

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701 1 |a Svyatkin  |b L. A.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of Physical and Mathematical Sciences  |f 1988-  |g Leonid Aleksandrovich  |9 17747 
701 1 |a Ognev  |b S. O.  |c Specialist in the field of nuclear technologies  |c Engineer of Tomsk Polytechnic University  |f 1999-  |g Sergey Olegovich  |9 22797 
701 1 |a Syrtanov  |b M. S.  |c physicist  |c Associate Professor, Researcher of Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1990-  |g Maksim Sergeevich  |9 18114 
701 1 |a Koroteev  |b Yu. M.  |c physicist  |c programming specialist at Tomsk Polytechnic University  |f 1959-  |g Yuri Mikhailovich  |9 14772 
712 0 2 |a National Research Tomsk Polytechnic University  |c (2009- )  |9 27197 
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