Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography
| Parent link: | NDT & E International Vol. 130.— 2022.— [102673, 9 p.] |
|---|---|
| Corporate Author: | |
| Other Authors: | , , , |
| Summary: | Title screen This study introduces a novel approach to the presentation of the probability of detection (POD) function in infrared (IR) thermographic nondestructive testing. The modified POD is suggested as a function of two defect parameters, namely, defect depth and lateral size. The proposed approach is based on calculating theoretical values of maximum temperature contrast for many defect size/depth combinations by using an appropriate analytical model. Furthermore, these values are used for the quantification of defects to produce predicted POD curves by applying a signal/response method. The results appear as the POD maps illustrating detectability of defects with various size/depth combinations. By setting a particular POD threshold, for example, 90%, the detectability limit contours can be obtained. These contours illustrate the limiting combinations of the depth and diameter of the defects, which can be detected with a required probability of correct detection under a particular temperature signal threshold. The proposed methodology is illustrated with an example of using the POD approach in pulsed IR thermographic inspection of a 3D printed specimen with artificial sphere-like defects. Such an approach allows predicting the detectability of defects in a vast range of depth/size ratios by using an analytical model and a limited number of experiments. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2022
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| Subjects: | |
| Online Access: | https://doi.org/10.1016/j.ndteint.2022.102673 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=669294 |
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| 200 | 1 | |a Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography |f A. I. Moskovchenko, M. Svantner, V. P. Vavilov, A. O. Chulkov | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 36 tit.] | ||
| 330 | |a This study introduces a novel approach to the presentation of the probability of detection (POD) function in infrared (IR) thermographic nondestructive testing. The modified POD is suggested as a function of two defect parameters, namely, defect depth and lateral size. The proposed approach is based on calculating theoretical values of maximum temperature contrast for many defect size/depth combinations by using an appropriate analytical model. Furthermore, these values are used for the quantification of defects to produce predicted POD curves by applying a signal/response method. The results appear as the POD maps illustrating detectability of defects with various size/depth combinations. By setting a particular POD threshold, for example, 90%, the detectability limit contours can be obtained. These contours illustrate the limiting combinations of the depth and diameter of the defects, which can be detected with a required probability of correct detection under a particular temperature signal threshold. The proposed methodology is illustrated with an example of using the POD approach in pulsed IR thermographic inspection of a 3D printed specimen with artificial sphere-like defects. Such an approach allows predicting the detectability of defects in a vast range of depth/size ratios by using an analytical model and a limited number of experiments. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t NDT & E International | ||
| 463 | |t Vol. 130 |v [102673, 9 p.] |d 2022 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a probability of detection | |
| 610 | 1 | |a infrared thermography | |
| 610 | 1 | |a detectability | |
| 610 | 1 | |a defect depth | |
| 610 | 1 | |a инфракрасная термография | |
| 610 | 1 | |a обнаружение | |
| 701 | 1 | |a Moskovchenko |b A. I. |g Aleksey Igorevich | |
| 701 | 1 | |a Svantner |b M. |g Michal | |
| 701 | 1 | |a Vavilov |b V. P. |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT) |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) |f 1949- |g Vladimir Platonovich |3 (RuTPU)RU\TPU\pers\32161 |9 16163 | |
| 701 | 1 | |a Chulkov |b A. O. |c specialist in the field of non-destructive testing |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1989- |g Arseniy Olegovich |3 (RuTPU)RU\TPU\pers\32220 |9 16220 | |
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