The Microstructure of Zr/Nb Nanoscale Multilayer Coatings Irradiated with Helium Ions; Coatings; Vol. 13, iss. 1

Xehetasun bibliografikoak
Parent link:Coatings
Vol. 13, iss. 1.— 2023.— [193, 11 p.]
Erakunde egilea: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики
Beste egile batzuk: Laptev R. S. Roman Sergeevich, Stepanova E. N. Ekaterina Nikolaevna, Pushilina N. S. Natalia Sergeevna, Kashkarov E. B. Egor Borisovich, Krotkevich D. G. Dmitry Georgievich, Lomygin A. D. Anton Dmitrievich, Sidorin A. A. Aleksey Anatoljevich, Orlov O. I. Oleg Igorevich, Uglov V. V. Vladimir Vasiljevich
Gaia:Title screen
The effect of helium ion irradiation on the microstructure and properties of composites based on Zr/Nb nanoscale multilayer coatings (NMCs) was studied. X-ray diffraction (XRD), transmission electron microscopy (TEM), and variable-energy Doppler broadening spectroscopy (DBS) were used for the in-depth analysis of defects in the irradiated NMCs. After irradiation of the Zr/Nb NMCs with helium ions at a 1017 ion/cm2 dose, the layered structure was generally retained, but the internal stresses in the layers were increased, which caused wave-like distortion in the ion deposition zone. The Zr/Nb NMCs with an individual layer thickness of 25 nm were characterized by the smallest microstress changes, but single blisters were formed in the near-surface region. The microstructure of the Zr/Nb NMCs with a layer thickness of 100 nm exhibited relatively smaller changes upon helium ion irradiation. The prevailing positron-trapping center was the reduced-electron-density area at the interfaces before and after irradiation of the Zr/Nb NMCs regardless of the layer thickness. However, the layer thickness affected the DBS parameter profiles depending on the positron energy, which was probably due to the different localization of implanted ions within the layers or at the interfaces.
Hizkuntza:ingelesa
Argitaratua: 2023
Gaiak:
Sarrera elektronikoa:http://earchive.tpu.ru/handle/11683/74780
https://doi.org/10.3390/coatings13010193
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=668885

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200 1 |a The Microstructure of Zr/Nb Nanoscale Multilayer Coatings Irradiated with Helium Ions  |f R. S. Laptev, E. N. Stepanova, N. S. Pushilina [et al.] 
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300 |a Title screen 
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330 |a The effect of helium ion irradiation on the microstructure and properties of composites based on Zr/Nb nanoscale multilayer coatings (NMCs) was studied. X-ray diffraction (XRD), transmission electron microscopy (TEM), and variable-energy Doppler broadening spectroscopy (DBS) were used for the in-depth analysis of defects in the irradiated NMCs. After irradiation of the Zr/Nb NMCs with helium ions at a 1017 ion/cm2 dose, the layered structure was generally retained, but the internal stresses in the layers were increased, which caused wave-like distortion in the ion deposition zone. The Zr/Nb NMCs with an individual layer thickness of 25 nm were characterized by the smallest microstress changes, but single blisters were formed in the near-surface region. The microstructure of the Zr/Nb NMCs with a layer thickness of 100 nm exhibited relatively smaller changes upon helium ion irradiation. The prevailing positron-trapping center was the reduced-electron-density area at the interfaces before and after irradiation of the Zr/Nb NMCs regardless of the layer thickness. However, the layer thickness affected the DBS parameter profiles depending on the positron energy, which was probably due to the different localization of implanted ions within the layers or at the interfaces. 
461 |t Coatings 
463 |t Vol. 13, iss. 1  |v [193, 11 p.]  |d 2023 
610 1 |a электронный ресурс 
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701 1 |a Pushilina  |b N. S.  |c physicist  |c associate Professor of Tomsk Polytechnic University, candidate of physico-mathematical Sciences  |f 1984-  |g Natalia Sergeevna  |3 (RuTPU)RU\TPU\pers\30838  |9 15085 
701 1 |a Kashkarov  |b E. B.  |c Physicist  |c Associate Professor, Researcher of Tomsk Polytechnic University, Candidate of Physical and Mathematical Sciences  |f 1991-  |g Egor Borisovich  |3 (RuTPU)RU\TPU\pers\34949  |9 18267 
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