Practical limits of pulsed thermal NDT: The concept of additive/multiplicative noise

Bibliographic Details
Parent link:NDT & E International
Vol. 130.— 2022.— [102677, 10 p.]
Main Author: Vavilov V. P. Vladimir Platonovich
Corporate Author: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Тепловой контроль"
Other Authors: Chulkov A. O. Arseniy Olegovich, Shiryaev V. V. Vladimir Vasilyevich
Summary:Title screen
The approach to determining thermal nondestructive testing (TNDT) limits by defect parameters is presented on the base of the suggested concept of noise. The concept presumes that active TNDT limits are conditioned by the inherent noise, which can be conventionally classified for additive and multiplicative. It is shown that practical TNDT limits are associated with multiplicative noise, which can be conveniently expressed in terms of noise running contrast. Considering a certain interval of running contrast values adhered to a particular construction material can be useful when determining potentials of thermal NDT by minimal size and maximal depth of detected defects, for example, by using a simple analytical 1D model.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 2022
Subjects:
Online Access:https://doi.org/10.1016/j.ndteint.2022.102677
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=668571

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