Comprehensive sensor technologies in non-destructive testing and monitoring; Sensor Review; Vol. 40, iss. 3

Détails bibliographiques
Parent link:Sensor Review
Vol. 40, iss. 3.— 2020.— [P. 281]
Auteur principal: Muravyov (Murav’ev) S. V. Sergey Vasilyevich
Collectivité auteur: Национальный исследовательский Томский политехнический университет Инженерная школа информационных технологий и робототехники
Résumé:Title screen
The digitisation of the global economy requires quick decision-making by non-destructive testing (NDT) and/or non-destructive evaluation (NDE) experts, to maintain their position in the development of new, unique technologies and materials. In the context of fourth industrial revolution, characterised by increasing intensification of the use of information technology, the development of more advanced integrated sensor systems and technologies is required.
Режим доступа: по договору с организацией-держателем ресурса
Langue:anglais
Publié: 2020
Sujets:
Accès en ligne:https://doi.org/10.1108/SR-05-2020-767
Format: Électronique Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=668541

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