Orientation analysis of polymer thin films on metal surfaces via IR absorbance of the relative transition dipole moments

Bibliographische Detailangaben
Parent link:Applied Surface Science
Vol. 594.— 2022.— [153476, 10 p.]
Körperschaften: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научно-образовательный центр Б. П. Вейнберга, Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Лаборатория плазменных гибридных систем
Weitere Verfasser: Frue A. K. Andreas Kristian, Rutkowski S. Sven, Akimchenko I. O. Igor Olegovich, Tverdokhlebov S. I. Sergei Ivanovich, Frueh J. С. Johannes Christoph
Zusammenfassung:Title screen
Modern technology has increasing requirements for thin film based electronic devices. Many surface and electronic properties strongly depend on the orientation of the material. Industrial development has a need for cheap, non-destructive, and fast orientation analysis in different conditions. Infrared-orientation analysis is less represented in literature compared to other orientation methods, while offering a lot of unique advantages. In this respect for thin polymeric films, we propose infrared (IR) absorbance-spectroscopy near metal surfaces to distinguish the orientation of different molecular segments. By use of the ratio method, the calculation of the orientation becomes mostly independent from the angle of incidence and averages out aperture errors of the measurement setup, hence the given solutions are generally applicable for many setups. For the most common point groups, the hereby-presented mathematical solution is valid for thin films cast on metal surfaces. Extensive quantum mechanical calculations of the transition dipole moments are avoided for known IR spectroscopy bands. The detailed application of the given IR orientation analysis is demonstrated for the polymers polystyrene, polyethylene glycol, poly(methyl methacrylate) and polyvinyl acetate. Each segment of these polymers is analyzed for the preferred molecular orientation in respect to the surface.
Режим доступа: по договору с организацией-держателем ресурса
Sprache:Englisch
Veröffentlicht: 2022
Schlagworte:
Online-Zugang:https://doi.org/10.1016/j.apsusc.2022.153476
Format: Elektronisch Buchkapitel
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=668104

MARC

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200 1 |a Orientation analysis of polymer thin films on metal surfaces via IR absorbance of the relative transition dipole moments  |f A. K. Frue, S. Rutkowski, I. O. Akimchenko [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 69 tit.] 
330 |a Modern technology has increasing requirements for thin film based electronic devices. Many surface and electronic properties strongly depend on the orientation of the material. Industrial development has a need for cheap, non-destructive, and fast orientation analysis in different conditions. Infrared-orientation analysis is less represented in literature compared to other orientation methods, while offering a lot of unique advantages. In this respect for thin polymeric films, we propose infrared (IR) absorbance-spectroscopy near metal surfaces to distinguish the orientation of different molecular segments. By use of the ratio method, the calculation of the orientation becomes mostly independent from the angle of incidence and averages out aperture errors of the measurement setup, hence the given solutions are generally applicable for many setups. For the most common point groups, the hereby-presented mathematical solution is valid for thin films cast on metal surfaces. Extensive quantum mechanical calculations of the transition dipole moments are avoided for known IR spectroscopy bands. The detailed application of the given IR orientation analysis is demonstrated for the polymers polystyrene, polyethylene glycol, poly(methyl methacrylate) and polyvinyl acetate. Each segment of these polymers is analyzed for the preferred molecular orientation in respect to the surface. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Applied Surface Science 
463 |t Vol. 594  |v [153476, 10 p.]  |d 2022 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a group theory 
610 1 |a IR-spectroscopy 
610 1 |a polarization 
610 1 |a transition dipole moment 
610 1 |a IR-absorbance 
610 1 |a thin polymer films 
610 1 |a теория групп 
610 1 |a ИК-спектроскопия 
610 1 |a поляризация 
701 1 |a Frue  |b A. K.  |g Andreas Kristian 
701 1 |a Rutkowski  |b S.  |c chemist  |c Research Engineer, Tomsk Polytechnic University, Ph.D  |f 1981-  |g Sven  |3 (RuTPU)RU\TPU\pers\46773  |9 22409 
701 1 |a Akimchenko  |b I. O.  |c Physicist  |c Engineer of Tomsk Polytechnic University  |f 1996-  |g Igor Olegovich  |9 22643 
701 1 |a Tverdokhlebov  |b S. I.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical science  |f 1961-  |g Sergei Ivanovich  |3 (RuTPU)RU\TPU\pers\30855  |9 15101 
701 1 |a Frueh  |b J. С.  |c specialist in the field of medical technology  |c Researcher of Tomsk Polytechnic University, Ph.D  |f 1983-  |g Johannes Christoph  |3 (RuTPU)RU\TPU\pers\47197 
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712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа ядерных технологий  |b Лаборатория плазменных гибридных систем  |3 (RuTPU)RU\TPU\col\23381 
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