Ghyngazov A. S. Aleksandr Sergeevich, Surzhikov A. P. Anatoly Petrovich, & Gyngazov S. A. Sergey Anatolievich. (2021). Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021. https://doi.org/10.1134/S1027451021060094
Chicago-referens (17:e uppl.)Ghyngazov A. S. Aleksandr Sergeevich, Surzhikov A. P. Anatoly Petrovich, och Gyngazov S. A. Sergey Anatolievich. Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021, 2021. https://doi.org/10.1134/S1027451021060094.
MLA-referens (9:e uppl.)Ghyngazov A. S. Aleksandr Sergeevich, et al. Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021, 2021. https://doi.org/10.1134/S1027451021060094.