Ghyngazov A. S. Aleksandr Sergeevich, Surzhikov A. P. Anatoly Petrovich, & Gyngazov S. A. Sergey Anatolievich. (2021). Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021. https://doi.org/10.1134/S1027451021060094
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Ghyngazov A. S. Aleksandr Sergeevich, Surzhikov A. P. Anatoly Petrovich, و Gyngazov S. A. Sergey Anatolievich. Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021, 2021. https://doi.org/10.1134/S1027451021060094.
توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)Ghyngazov A. S. Aleksandr Sergeevich, et al. Influence of the Substrate Roughness on the Accuracy of Measuring the Impurity Depth Distribution by Secondary-Ion Mass Spectrometry. 2021, 2021. https://doi.org/10.1134/S1027451021060094.