Low Cost Embedded Copper Mesh Based on Cracked Template for Highly Durability Transparent EMI Shielding Films; Materials; Vol. 15, iss. 4

Dades bibliogràfiques
Parent link:Materials
Vol. 15, iss. 4.— 2022.— [1449, 17 p.]
Autor corporatiu: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научно-образовательный центр Б. П. Вейнберга
Altres autors: Voronin A. S. Anton Sergeevich, Fadeev Yu. V. Yurii, Makeev M. O. Mstislav Olegovich, Mikhalev P. A. Pavel Alekseevich, Osipkov A. S. Alexey Sergeevich, Provatorov A. S. Alexander Sergeevich, Ryzhenko D. S. Dmitriy Sergeevich, Yurkov G. Yu. Gleb Yurjevich, Simunin M. M. Mikhail Maksimovich, Karpova D. V. Darina Valerjevna, Lukyanenko A. V. Anna Vitaljevna, Kokh D. Diete, Bainov D. D. Dashi Dambaevich
Sumari:Title screen
Embedded copper mesh coatings with low sheet resistance and high transparency were formed using a low-cost Cu seed mesh obtained with a magnetron sputtering on a cracked template, and subsequent operations electroplating and embedding in a photocurable resin layer. The influence of the mesh size on the optoelectric characteristics and the electromagnetic shielding efficiency in a wide frequency range is considered. In optimizing the coating properties, a shielding efficiency of 49.38 dB at a frequency of 1 GHz, with integral optical transparency in the visible range of 84.3%, was obtained. Embedded Cu meshes have been shown to be highly bending stable and have excellent adhesion strength. The combination of properties and economic costs for the formation of coatings indicates their high prospects for practical use in shielding transparent objects, such as windows and computer monitors.
Idioma:anglès
Publicat: 2022
Matèries:
Accés en línia:https://doi.org/10.3390/ma15041449
Format: MixedMaterials Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667815

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200 1 |a Low Cost Embedded Copper Mesh Based on Cracked Template for Highly Durability Transparent EMI Shielding Films  |f A. S. Voronin, Yu. V. Fadeev, M. O. Makeev [et al.] 
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300 |a Title screen 
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330 |a Embedded copper mesh coatings with low sheet resistance and high transparency were formed using a low-cost Cu seed mesh obtained with a magnetron sputtering on a cracked template, and subsequent operations electroplating and embedding in a photocurable resin layer. The influence of the mesh size on the optoelectric characteristics and the electromagnetic shielding efficiency in a wide frequency range is considered. In optimizing the coating properties, a shielding efficiency of 49.38 dB at a frequency of 1 GHz, with integral optical transparency in the visible range of 84.3%, was obtained. Embedded Cu meshes have been shown to be highly bending stable and have excellent adhesion strength. The combination of properties and economic costs for the formation of coatings indicates their high prospects for practical use in shielding transparent objects, such as windows and computer monitors. 
461 |t Materials 
463 |t Vol. 15, iss. 4  |v [1449, 17 p.]  |d 2022 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a transparent electromagnetic interference (EMI) shielding films 
610 1 |a cracked template 
610 1 |a electroplating 
610 1 |a photocurable resin 
610 1 |a embedded mesh 
610 1 |a durability 
610 1 |a прозрачные пленки 
610 1 |a гальванизм 
701 1 |a Voronin  |b A. S.  |g Anton Sergeevich 
701 1 |a Fadeev  |b Yu. V.  |g Yurii 
701 1 |a Makeev  |b M. O.  |g Mstislav Olegovich 
701 1 |a Mikhalev  |b P. A.  |g Pavel Alekseevich 
701 1 |a Osipkov  |b A. S.  |g Alexey Sergeevich 
701 1 |a Provatorov  |b A. S.  |g Alexander Sergeevich 
701 1 |a Ryzhenko  |b D. S.  |g Dmitriy Sergeevich 
701 1 |a Yurkov  |b G. Yu.  |g Gleb Yurjevich 
701 1 |a Simunin  |b M. M.  |g Mikhail Maksimovich 
701 1 |a Karpova  |b D. V.  |g Darina Valerjevna 
701 1 |a Lukyanenko  |b A. V.  |g Anna Vitaljevna 
701 1 |a Kokh  |b D.  |g Diete 
701 1 |a Bainov  |b D. D.  |c Specialist in the field of plasma technologies  |c Researcher of the Tomsk Polytechnic University, Candidate of technical sciences  |f 1978-  |g Dashi Dambaevich  |3 (RuTPU)RU\TPU\pers\34161  |9 17701 
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