Observation of soft X-ray Cherenkov radiation in Be and Si foils; Journal of Instrumentation; Vol. 16, iss. 7

Dades bibliogràfiques
Parent link:Journal of Instrumentation
Vol. 16, iss. 7.— 2021.— [P07043, 14 p.]
Autor principal: Uglov S. R. Sergey Romanovich
Autor corporatiu: Национальный исследовательский Томский политехнический университет Физико-технический институт Кафедра прикладной физики (№ 12) Международная научно-образовательная лаборатория "Рентгеновская оптика", Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Altres autors: Vukolov A. V. Artem Vladimirovich
Sumari:Title screen
Currently, most of the Cherenkov phenomenon researches for the X-ray region are theoretical studies; there are only a few experiments in this area. Here the new experimental results on observation of X-ray Cherenkov radiation generated by 5.7 MeV electrons in the thin Be and Si foils are presented. The Cherenkov effect from Be was observed for the first time. The experimental results are compared with the calculations performed according to the theoretical model of transition radiation taking into account the oxide layer on the target output surface.
Idioma:anglès
Publicat: 2021
Matèries:
Accés en línia:https://doi.org/10.1088/1748-0221/16/07/P07043
Format: MixedMaterials Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667744