A Method for Endurance Testing of Enameled Round and Rectangular Wires for Motors Controlled by SiC-based Inverters
| Parent link: | IEEE Transactions on Dielectrics and Electrical Insulation Vol. 28, iss. 6.— 2021.— P. 2091-2098 |
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| Corporate Authors: | , |
| Outros Autores: | , , , , |
| Resumo: | Title screen The purpose of this article is to propose a method for investigating the influence of the impulse voltage waveform generated by inverters based on wide bandgap semiconductors on the insulation endurance of magnet wires. In this regard, endurance tests of enamel insulation are performed on a designed test bench, which generates repetitive voltage pulses with ns-level rising and falling times corresponding to modern silicon carbide-based inverters. Furthermore, we suggest a novel specimen's shape for testing enameled rectangular section magnet wires which find their application in electric traction motors. Considerations related to the deterioration of dielectrics subjected to impulse voltage with high slew rates and high switching frequency are given. AM_Agreement |
| Idioma: | inglês |
| Publicado em: |
2021
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| Assuntos: | |
| Acesso em linha: | https://doi.org/10.1109/TDEI.2021.009587 |
| Formato: | Recurso Electrónico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667639 |
| Resumo: | Title screen The purpose of this article is to propose a method for investigating the influence of the impulse voltage waveform generated by inverters based on wide bandgap semiconductors on the insulation endurance of magnet wires. In this regard, endurance tests of enamel insulation are performed on a designed test bench, which generates repetitive voltage pulses with ns-level rising and falling times corresponding to modern silicon carbide-based inverters. Furthermore, we suggest a novel specimen's shape for testing enameled rectangular section magnet wires which find their application in electric traction motors. Considerations related to the deterioration of dielectrics subjected to impulse voltage with high slew rates and high switching frequency are given. AM_Agreement |
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| DOI: | 10.1109/TDEI.2021.009587 |