Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser; Scientific Reports; Vol. 8
| Parent link: | Scientific Reports Vol. 8.— 2018.— [2219, 9 p.] |
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| Autor kompanije: | |
| Daljnji autori: | , , , , , , , , , , , , , , , |
| Sažetak: | Title screen X-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the frst time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in difraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is diferent from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is signifcantly shorter than expected from the electron bunch measurements. |
| Jezik: | engleski |
| Izdano: |
2018
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| Teme: | |
| Online pristup: | https://doi.org/10.1038/s41598-018-19793-1 |
| Format: | MixedMaterials Elektronički Poglavlje knjige |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=667266 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 667266 | ||
| 005 | 20250307144220.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\38471 | ||
| 035 | |a RU\TPU\network\38241 | ||
| 090 | |a 667266 | ||
| 100 | |a 20220311d2018 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser |f O. Yu. Gorobtsov, N. Mukharamova, S. V. Lazarev [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 58 tit.] | ||
| 330 | |a X-ray free-electron lasers (XFELs) provide extremely bright and highly spatially coherent x-ray radiation with femtosecond pulse duration. Currently, they are widely used in biology and material science. Knowledge of the XFEL statistical properties during an experiment may be vitally important for the accurate interpretation of the results. Here, for the frst time, we demonstrate Hanbury Brown and Twiss (HBT) interferometry performed in difraction mode at an XFEL source. It allowed us to determine the XFEL statistical properties directly from the Bragg peaks originating from colloidal crystals. This approach is diferent from the traditional one when HBT interferometry is performed in the direct beam without a sample. Our analysis has demonstrated nearly full (80%) global spatial coherence of the XFEL pulses and an average pulse duration on the order of ten femtoseconds for the monochromatized beam, which is signifcantly shorter than expected from the electron bunch measurements. | ||
| 461 | |t Scientific Reports | ||
| 463 | |t Vol. 8 |v [2219, 9 p.] |d 2018 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a интерферометрия | |
| 610 | 1 | |a рентгеновские лазеры | |
| 610 | 1 | |a рентгеновские излучения | |
| 610 | 1 | |a свободные электроны | |
| 701 | 1 | |a Gorobtsov |b O. Yu. | |
| 701 | 1 | |a Mukharamova |b N. | |
| 701 | 1 | |a Lazarev |b S. V. |c physicist |c engineer at Tomsk Polytechnic University |f 1984- |g Sergey Vladimirovich |3 (RuTPU)RU\TPU\pers\35210 | |
| 701 | 1 | |a Chollet |b M. | |
| 701 | 1 | |a Zhu |b D. | |
| 701 | 1 | |a Feng |b Y. | |
| 701 | 1 | |a Kurta |b R. P. | |
| 701 | 1 | |a Meije |b J. -M. | |
| 701 | 1 | |a Williams |b G. | |
| 701 | 1 | |a Sikorski |b M. | |
| 701 | 1 | |a Song |b S. | |
| 701 | 1 | |a Dzhigaev |b D. | |
| 701 | 1 | |a Serkez |b S. | |
| 701 | 1 | |a Singer |b A. | |
| 701 | 1 | |a Petukhov |b A. V. | |
| 701 | 1 | |a Vartanyants |b I. A. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Центр промышленной томографии |b Международная научно-образовательная лаборатория неразрушающего контроля |3 (RuTPU)RU\TPU\col\19961 |
| 801 | 2 | |a RU |b 63413507 |c 20220311 |g RCR | |
| 856 | 4 | |u https://doi.org/10.1038/s41598-018-19793-1 | |
| 942 | |c CF | ||