Infrared thermographic testing of hyperconductive flat heat pipes; Optical Engineering; Vol. 57, iss. 3

Detaylı Bibliyografya
Parent link:Optical Engineering
Vol. 57, iss. 3.— 2018.— [035105, 2 p.]
Kurumsal yazarlar: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Испытательный центр Лаборатория радиационных испытаний материалов и изделий, Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Тепловой контроль"
Diğer Yazarlar: Simonova O. S. Olga Sergeevna, Vavilov V. P. Vladimir Platonovich, Chulkov A. O. Arseniy Olegovich, Suntsov S. B. Sergey Borisovich
Özet:Title screen
Active infrared thermography has been applied for the evaluation of the internal structure and operation quality of hyperconductive flat mini heat pipes used in satellite electronics. The distribution of effective transverse thermal diffusivity in heat pipes has been obtained by means of the Parker technique to exhibit areas with low content of fluid in the porous structure. The lateral components of thermal diffusivity were determined by placing a slit mask between a flash heater and a heat pipe. Peculiarities of heat pipe operation in a working regime have been experimentally studied by placing a local heat source on the pipe surface and following the surface temperature dynamics.
Dil:İngilizce
Baskı/Yayın Bilgisi: 2018
Konular:
Online Erişim:https://doi.org/10.1117/1.OE.57.3.035105
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666987

MARC

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330 |a Active infrared thermography has been applied for the evaluation of the internal structure and operation quality of hyperconductive flat mini heat pipes used in satellite electronics. The distribution of effective transverse thermal diffusivity in heat pipes has been obtained by means of the Parker technique to exhibit areas with low content of fluid in the porous structure. The lateral components of thermal diffusivity were determined by placing a slit mask between a flash heater and a heat pipe. Peculiarities of heat pipe operation in a working regime have been experimentally studied by placing a local heat source on the pipe surface and following the surface temperature dynamics. 
461 |t Optical Engineering 
463 |t Vol. 57, iss. 3  |v [035105, 2 p.]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a thermal effects 
610 1 |a infrared radiation 
610 1 |a thermography 
610 1 |a satellites 
610 1 |a nondestructive evaluation 
610 1 |a infrared imaging 
610 1 |a optical engineering 
701 1 |a Simonova  |b O. S.  |c Specialist in the field of thermal engineering  |c Assistant of the Department of Tomsk Polytechnic University  |f 1986-  |g Olga Sergeevna  |3 (RuTPU)RU\TPU\pers\37861  |9 20552 
701 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
701 1 |a Chulkov  |b A. O.  |c specialist in the field of non-destructive testing  |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1989-  |g Arseniy Olegovich  |3 (RuTPU)RU\TPU\pers\32220  |9 16220 
701 1 |a Suntsov  |b S. B.  |g Sergey Borisovich 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Испытательный центр  |b Лаборатория радиационных испытаний материалов и изделий  |3 (RuTPU)RU\TPU\col\24977 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Центр промышленной томографии  |b Научно-производственная лаборатория "Тепловой контроль"  |3 (RuTPU)RU\TPU\col\23838 
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