Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 11, iss. 6
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Vol. 11, iss. 6.— 2017.— [P. 1109-1112] |
|---|---|
| Korporace: | , |
| Další autoři: | , , , , , , |
| Shrnutí: | Title screen The spectra of X-ray diffraction from the reflecting atomic plane of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250○C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6○ and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam. |
| Jazyk: | angličtina |
| Vydáno: |
2017
|
| Témata: | |
| On-line přístup: | https://doi.org/10.1134/S1027451017050111 |
| Médium: | MixedMaterials Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666978 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 666978 | ||
| 005 | 20250228141854.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\38182 | ||
| 035 | |a RU\TPU\network\20498 | ||
| 090 | |a 666978 | ||
| 100 | |a 20220209d2017 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal |f A. R. Mkrtchan (Mkrtchyan), A. P. Potylitsyn, A. V. Vukolov [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 10 tit.] | ||
| 330 | |a The spectra of X-ray diffraction from the reflecting atomic plane of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250○C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6○ and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam. | ||
| 461 | |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | ||
| 463 | |t Vol. 11, iss. 6 |v [P. 1109-1112] |d 2017 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a X-ray radiation | |
| 610 | 1 | |a crystal | |
| 610 | 1 | |a quartz | |
| 610 | 1 | |a temperature gradient | |
| 610 | 1 | |a рентгеновские излучения | |
| 610 | 1 | |a кристаллы | |
| 610 | 1 | |a кварц | |
| 610 | 1 | |a температурные градиенты | |
| 701 | 1 | |a Mkrtchan (Mkrtchyan) |b A. R. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1937- |g Alpik Rafaelovich |3 (RuTPU)RU\TPU\pers\34236 | |
| 701 | 1 | |a Potylitsyn |b A. P. |c Russian physicist |c Professor of the TPU |f 1945- |g Alexander Petrovich |3 (RuTPU)RU\TPU\pers\26306 |9 12068 | |
| 701 | 1 | |a Vukolov |b A. V. |c physicist |c Research associate of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1978- |g Artem Vladimirovich |3 (RuTPU)RU\TPU\pers\31209 |9 15405 | |
| 701 | 1 | |a Novokshonov |b A. I. |g Artyom Igorevich | |
| 701 | 1 | |a Gogolev |b A. S. |c physicist |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1983- |g Aleksey Sergeevich |3 (RuTPU)RU\TPU\pers\31537 |9 15698 | |
| 701 | 1 | |a Amiragyan |b R. V. |g Ruben | |
| 701 | 1 | |a Movsisyan |b A. E. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Исследовательская школа физики высокоэнергетических процессов |c (2017- ) |3 (RuTPU)RU\TPU\col\23551 |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Физико-технический институт |b Кафедра прикладной физики (№ 12) |b Международная научно-образовательная лаборатория "Рентгеновская оптика" |3 (RuTPU)RU\TPU\col\19530 |
| 801 | 2 | |a RU |b 63413507 |c 20220209 |g RCR | |
| 856 | 4 | |u https://doi.org/10.1134/S1027451017050111 | |
| 942 | |c CF | ||