Ptychographic X-Ray Imaging of Colloidal Crystals; Small; Vol. 14, iss. 3
| Parent link: | Small Vol. 14, iss. 3.— 2018.— [1702575, 8 p.] |
|---|---|
| Coauteur: | |
| Andere auteurs: | , , , , |
| Samenvatting: | Ptychographic coherent X-ray imaging is applied to obtain a projection of the electron density of colloidal crystals, which are promising nanoscale materials for optoelectronic applications and important model systems. Using the incident X-ray wavefield reconstructed by mixed states approach, a high resolution and high contrast image of the colloidal crystal structure is obtained by ptychography. The reconstructed colloidal crystal reveals domain structure with an average domain size of about 2 µm. Comparison of the domains formed by the basic close-packed structures, allows us to conclude on the absence of pure hexagonal close-packed domains and confirms the presence of random hexagonal close-packed layers with predominantly face-centered cubic structure within the analyzed part of the colloidal crystal film. The ptychography reconstruction shows that the final structure is complicated and may contain partial dislocations leading to a variation of the stacking sequence in the lateral direction. As such in this work, X-ray ptychography is extended to high resolution imaging of crystalline samples. Режим доступа: по договору с организацией-держателем ресурса |
| Taal: | Engels |
| Gepubliceerd in: |
2018
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| Onderwerpen: | |
| Online toegang: | https://doi.org/10.1002/smll.201702575 |
| Formaat: | xMaterials Elektronisch Hoofdstuk |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666929 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 666929 | ||
| 005 | 20250227143241.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\38133 | ||
| 035 | |a RU\TPU\network\29940 | ||
| 090 | |a 666929 | ||
| 100 | |a 20220207d2018 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a US | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Ptychographic X-Ray Imaging of Colloidal Crystals |f S. V. Lazarev, I. S. Besedin, A. V. Zozulya [et al.] | |
| 203 | |a Text |c electronic | ||
| 320 | |a [References: 69 tit.] | ||
| 330 | |a Ptychographic coherent X-ray imaging is applied to obtain a projection of the electron density of colloidal crystals, which are promising nanoscale materials for optoelectronic applications and important model systems. Using the incident X-ray wavefield reconstructed by mixed states approach, a high resolution and high contrast image of the colloidal crystal structure is obtained by ptychography. The reconstructed colloidal crystal reveals domain structure with an average domain size of about 2 µm. Comparison of the domains formed by the basic close-packed structures, allows us to conclude on the absence of pure hexagonal close-packed domains and confirms the presence of random hexagonal close-packed layers with predominantly face-centered cubic structure within the analyzed part of the colloidal crystal film. The ptychography reconstruction shows that the final structure is complicated and may contain partial dislocations leading to a variation of the stacking sequence in the lateral direction. As such in this work, X-ray ptychography is extended to high resolution imaging of crystalline samples. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Small | ||
| 463 | |t Vol. 14, iss. 3 |v [1702575, 8 p.] |d 2018 | ||
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a рентгеновские изображения | |
| 610 | 1 | |a кристаллы | |
| 610 | 1 | |a электронная плотность | |
| 610 | 1 | |a наноразмерные материалы | |
| 701 | 1 | |a Lazarev |b S. V. |c physicist |c engineer at Tomsk Polytechnic University |f 1984- |g Sergey Vladimirovich |3 (RuTPU)RU\TPU\pers\35210 | |
| 701 | 1 | |a Besedin |b I. S. |g Ilya | |
| 701 | 1 | |a Zozulya |b A. V. |g Alexey | |
| 701 | 1 | |a Mieke |b M. J. |g Meijer Janne | |
| 701 | 1 | |a Dzhigaev |b D. |g Dmitry | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Центр промышленной томографии |b Международная научно-образовательная лаборатория неразрушающего контроля |3 (RuTPU)RU\TPU\col\19961 |
| 801 | 2 | |a RU |b 63413507 |c 20220207 |g RCR | |
| 856 | 4 | 0 | |u https://doi.org/10.1002/smll.201702575 |
| 942 | |c CF | ||