The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

Библиографические подробности
Источник:	Electron, Positron, Neutron and X–ray Scattering under External Influences.— 2021.— [P. 67]
Автор-организация:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Другие авторы:	Stuchebrov S. G. Sergey Gennadevich, Bulavskaya A. A. Angelina Aleksandrovna, Grigorieva (Grigorjeva) A. A. Anna Anatoljevna, Miloichikova I. A. Irina Alekseevna
Примечания:	Title screen
Язык:	английский
Опубликовано:	2021
Предметы:	электронный ресурс труды учёных ТПУ
Online-ссылка:	https://mega.nz/file/03xFxAzT#T3XlgNx10CZkFgX0jova9LUW6w3wQorXQ28dn5YNUOY
Формат:	Электронный ресурс Статья
Запись в KOHA:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666647

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