The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

Manylion Llyfryddiaeth
Parent link:	Electron, Positron, Neutron and X–ray Scattering under External Influences.— 2021.— [P. 67]
Awdur Corfforaethol:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Awduron Eraill:	Stuchebrov S. G. Sergey Gennadevich, Bulavskaya A. A. Angelina Aleksandrovna, Grigorieva (Grigorjeva) A. A. Anna Anatoljevna, Miloichikova I. A. Irina Alekseevna
Crynodeb:	Title screen
Iaith:	Saesneg
Cyhoeddwyd:	2021
Pynciau:	электронный ресурс труды учёных ТПУ
Mynediad Ar-lein:	https://mega.nz/file/03xFxAzT#T3XlgNx10CZkFgX0jova9LUW6w3wQorXQ28dn5YNUOY
Fformat:	Electronig Pennod Llyfr
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666647

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