The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

Detalles Bibliográficos
Parent link:	Electron, Positron, Neutron and X–ray Scattering under External Influences: International Conference, 18 –24 October 2021, Yerevan, Armenia. [P. 67].— , 2021
Autor Corporativo:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Outros autores:	Stuchebrov S. G. Sergey Gennadevich, Bulavskaya A. A. Angelina Aleksandrovna, Grigorieva (Grigorjeva) A. A. Anna Anatoljevna, Miloichikova I. A. Irina Alekseevna
Summary:	Title screen
Publicado:	2021
Subjects:	электронный ресурс труды учёных ТПУ
Acceso en liña:	https://mega.nz/file/03xFxAzT#T3XlgNx10CZkFgX0jova9LUW6w3wQorXQ28dn5YNUOY
Formato:	Electrónico Capítulo de libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666647

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