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The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

The Multi-Angle Scanning Method Application for X-Ray and Electron Beams Profiles Measurement

Bibliografiska uppgifter
Parent link:Electron, Positron, Neutron and X–ray Scattering under External Influences.— 2021.— [P. 67]
Institutionell upphovsman: Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Övriga upphovsmän: Stuchebrov S. G. Sergey Gennadevich, Bulavskaya A. A. Angelina Aleksandrovna, Grigorieva (Grigorjeva) A. A. Anna Anatoljevna, Miloichikova I. A. Irina Alekseevna
Sammanfattning:Title screen
Språk:engelska
Publicerad: 2021
Ämnen:
электронный ресурс
труды учёных ТПУ
Länkar:https://mega.nz/file/03xFxAzT#T3XlgNx10CZkFgX0jova9LUW6w3wQorXQ28dn5YNUOY
Materialtyp: Elektronisk Bokavsnitt
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666647
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Sammanfattning:Title screen

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