Scales and covers in general measurement problem; IEEE Transactions on Instrumentation and Measurement; Vol. 46, iss. 4

Detaylı Bibliyografya
Parent link:IEEE Transactions on Instrumentation and Measurement
Vol. 46, iss. 4.— 1997.— [P. 961-965]
Yazar: Muravyov (Murav’ev) S. V. Sergey Vasilyevich
Diğer Yazarlar: Savolainen V.
Özet:Title screen
A demonstration is given that in terms of representational theory the general measurement problem (GMP) can be treated as a discrete optimization problem. Moreover, particular discrete optimization problems appear at every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit the management of many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in the context of measurement with numerical examples. This approach also allows consideration from an integrated point of view of any kind of functions of measurement information systems: check, diagnosis, and pattern recognition.
Режим доступа: по договору с организацией-держателем ресурса
Dil:İngilizce
Baskı/Yayın Bilgisi: 1997
Konular:
Online Erişim:https://doi.org/10.1109/19.650808
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666381

MARC

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330 |a A demonstration is given that in terms of representational theory the general measurement problem (GMP) can be treated as a discrete optimization problem. Moreover, particular discrete optimization problems appear at every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit the management of many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in the context of measurement with numerical examples. This approach also allows consideration from an integrated point of view of any kind of functions of measurement information systems: check, diagnosis, and pattern recognition. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
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700 1 |a Muravyov (Murav’ev)  |b S. V.  |c specialist in the field of control and measurement equipment  |c Professor of Tomsk Polytechnic University,Doctor of technical sciences  |f 1954-  |g Sergey Vasilyevich  |3 (RuTPU)RU\TPU\pers\31262  |9 15440 
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