Scanning Probe Microscopy: электронный курс

Scanning Probe Microscopy: электронный курс

Detalhes bibliográficos
Autor principal: Кузнецов П. В. Павел Викторович
Autor Corporativo: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики
Resumo:Заглавие с экрана
In the electronic course "Scanning probe microscopy" the fundamental principles of modern methods of scanning probe microscopy, primarily scanning tunneling microscopy (STM) and scanning force microscopy (SFM), both regarding theory and practice are considered. The physical foundation and theory of STM and SFM as well as the basic measurement modes are treated thoroughly. An overview of other SPM techniques is given. The main parts and the construction of scanning probe microscopes are considered, as well as the materials from which they are made. The course also dwells on advanced measurement and analysis methods, artefacts, as well as manipulation with STM and SFM. Several examples of the use of SPM techniques in current research are given. The knowledge gained upon the course successful completion will allow students to choose an adequate method or SPM mode for studying surface properties in accordance with the research objectives, critically evaluate the data obtained in terms of the impact of possible artifacts, and process and analyze the results.
Доступ по логину и паролю
Idioma:russo
Publicado em: Томск, TPU Moodle, 2019
Assuntos:
Микроскопические исследования
электронный ресурс
труды учёных ТПУ
электронное обучение
электронные курсы ТПУ
электронные учебные пособия
учебные пособия
Acesso em linha:https://design.lms.tpu.ru/course/view.php?id=2944
Formato: Recurso Eletrônico Livro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=666317

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