Hard X-Ray diffraction in quartz single crystals in the presence of temperature gradient; Journal of Contemporary Physics (Armenian Academy of Sciences); Vol. 52, iss. 4

Xehetasun bibliografikoak
Parent link:Journal of Contemporary Physics (Armenian Academy of Sciences)
Vol. 52, iss. 4.— 2017.— [P. 392-398]
Egile nagusia: Kocharyan V. R. Vagan Rashidovich
Erakunde egilea: Национальный исследовательский Томский политехнический университет
Gaia:Title screen
The diffraction of hard X-rays in quartz single crystals is considered in the Laue geometry in the presence of temperature gradient. Spectral and angular characteristics of the reflected beam were experimentally studied versus the magnitude of temperature gradient. It is shown that as the temperature gradient applied perpendicular to reflecting (10i1) atomic planes of quartz single crystal increases, the focus of reflected beam approaches the crystal, the angular and spectral widths increase, and intensity increases by orders of magnitude.
Режим доступа: по договору с организацией-держателем ресурса
Hizkuntza:ingelesa
Argitaratua: 2017
Gaiak:
Sarrera elektronikoa:https://doi.org/10.3103/S1068337217040132
Formatua: MixedMaterials Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665852

Antzeko izenburuak