Hard X-Ray diffraction in quartz single crystals in the presence of temperature gradient

Détails bibliographiques
Parent link:Journal of Contemporary Physics (Armenian Academy of Sciences)
Vol. 52, iss. 4.— 2017.— [P. 392-398]
Auteur principal: Kocharyan V. R. Vagan Rashidovich
Collectivité auteur: Национальный исследовательский Томский политехнический университет
Résumé:Title screen
The diffraction of hard X-rays in quartz single crystals is considered in the Laue geometry in the presence of temperature gradient. Spectral and angular characteristics of the reflected beam were experimentally studied versus the magnitude of temperature gradient. It is shown that as the temperature gradient applied perpendicular to reflecting (10i1) atomic planes of quartz single crystal increases, the focus of reflected beam approaches the crystal, the angular and spectral widths increase, and intensity increases by orders of magnitude.
Режим доступа: по договору с организацией-держателем ресурса
Publié: 2017
Sujets:
Accès en ligne:https://doi.org/10.3103/S1068337217040132
Format: Électronique Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665852
Description
Résumé:Title screen
The diffraction of hard X-rays in quartz single crystals is considered in the Laue geometry in the presence of temperature gradient. Spectral and angular characteristics of the reflected beam were experimentally studied versus the magnitude of temperature gradient. It is shown that as the temperature gradient applied perpendicular to reflecting (10i1) atomic planes of quartz single crystal increases, the focus of reflected beam approaches the crystal, the angular and spectral widths increase, and intensity increases by orders of magnitude.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.3103/S1068337217040132