Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography; Materials; Vol. 14, iss. 8
| Parent link: | Materials Vol. 14, iss. 8.— 2021.— [1886, 20 p.] |
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| Ente Autore: | |
| Altri autori: | , , , |
| Riassunto: | Title screen This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects. The method is based on the combination of a known analytical model and a non-linear fitting (NLF) procedure. The algorithm was verified both numerically and experimentally on 3D-printed polylactic acid plastic samples. The accuracy of depth prediction using the proposed method was compared with the reference characterization technique based on thermographic signal reconstruction to demonstrate the efficiency of the proposed NLF method. |
| Lingua: | inglese |
| Pubblicazione: |
2021
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| Soggetti: | |
| Accesso online: | http://earchive.tpu.ru/handle/11683/68961 https://doi.org/10.3390/ma14081886 |
| Natura: | MixedMaterials Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665700 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 665700 | ||
| 005 | 20250204164140.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\36904 | ||
| 035 | |a RU\TPU\network\36901 | ||
| 090 | |a 665700 | ||
| 100 | |a 20211109d2021 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a CH | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography |f A. I. Moskovchenko, M. Svantner, V. P. Vavilov, A. O. Chulkov | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 35 tit.] | ||
| 330 | |a This study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects. The method is based on the combination of a known analytical model and a non-linear fitting (NLF) procedure. The algorithm was verified both numerically and experimentally on 3D-printed polylactic acid plastic samples. The accuracy of depth prediction using the proposed method was compared with the reference characterization technique based on thermographic signal reconstruction to demonstrate the efficiency of the proposed NLF method. | ||
| 461 | |t Materials | ||
| 463 | |t Vol. 14, iss. 8 |v [1886, 20 p.] |d 2021 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a pulse thermography | |
| 610 | 1 | |a defect aspect ratio | |
| 610 | 1 | |a thermal reflection coefficient | |
| 610 | 1 | |a thermal NDT | |
| 610 | 1 | |a defect characterization | |
| 610 | 1 | |a non-linear fitting | |
| 610 | 1 | |a thermographic signal reconstruction | |
| 610 | 1 | |a термография | |
| 610 | 1 | |a неразрушающий контроль | |
| 610 | 1 | |a дефекты | |
| 701 | 1 | |a Moskovchenko |b A. I. |g Aleksey Igorevich | |
| 701 | 1 | |a Svantner |b M. |g Michal | |
| 701 | 1 | |a Vavilov |b V. P. |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT) |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) |f 1949- |g Vladimir Platonovich |3 (RuTPU)RU\TPU\pers\32161 |9 16163 | |
| 701 | 1 | |a Chulkov |b A. O. |c specialist in the field of non-destructive testing |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1989- |g Arseniy Olegovich |3 (RuTPU)RU\TPU\pers\32220 |9 16220 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Центр промышленной томографии |b Международная научно-образовательная лаборатория неразрушающего контроля |3 (RuTPU)RU\TPU\col\19961 |
| 801 | 2 | |a RU |b 63413507 |c 20211126 |g RCR | |
| 856 | 4 | |u http://earchive.tpu.ru/handle/11683/68961 | |
| 856 | 4 | |u https://doi.org/10.3390/ma14081886 | |
| 942 | |c CF | ||