Experimental verification of a plasmonic hook in a dielectric Janus particle

Detalles Bibliográficos
Parent link:Applied Physics Letters
Vol. 118, iss. 13.— 2021.— [131107, 5 p.]
Autor Corporativo: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Outros autores: Minin I. V. Igor Vladilenovich, Minin O. V. Oleg Vladilenovich, Glinsky I. A. Igor Andreevich, Khabibullin R. A. Rustam Anvarovich, Malureanu R. Radu, Lavrinenko A. V. Andrey Vladimirovich, Yakubovsky D. I. Dmitry Igorevich, Volkov V. S. Valentin Sergeevich, Ponomarev D. S. Dmitry Sergeevich
Summary:Title screen
We report on the experimental observation of the curved plasmonic beam, a plasmonic hook (PH), for surface plasmon-polariton (SPP) waves. The SPP PH effect could be obtained with a cuboid particle with broken shape symmetry fabricated with a relatively simple routine. This has a pronounced difference with fabrication of the structure for generation of the Airy SPPs, which require complex techniques to compensate the wave vector mismatch. We confirmed the existence of SPP PH by amplitude scattering scanning near-field optical microscopy. The experimental results agree well with our predictions. Importantly, the SPP PH demonstrates the smallest curvature of the beam ever recorded for SPPs compared to that for the Airy-family plasmonic beams, which potentially can strongly impact many useful applications from nanoparticle manipulation to nanoscale bio-sensing.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglés
Publicado: 2021
Subjects:
Acceso en liña:https://doi.org/10.1063/5.0043923
Formato: Electrónico Capítulo de libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=665341

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200 1 |a Experimental verification of a plasmonic hook in a dielectric Janus particle  |f I. V. Minin, O. V. Minin, I. A. Glinsky [et al.] 
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300 |a Title screen 
320 |a [References: 28 tit.] 
330 |a We report on the experimental observation of the curved plasmonic beam, a plasmonic hook (PH), for surface plasmon-polariton (SPP) waves. The SPP PH effect could be obtained with a cuboid particle with broken shape symmetry fabricated with a relatively simple routine. This has a pronounced difference with fabrication of the structure for generation of the Airy SPPs, which require complex techniques to compensate the wave vector mismatch. We confirmed the existence of SPP PH by amplitude scattering scanning near-field optical microscopy. The experimental results agree well with our predictions. Importantly, the SPP PH demonstrates the smallest curvature of the beam ever recorded for SPPs compared to that for the Airy-family plasmonic beams, which potentially can strongly impact many useful applications from nanoparticle manipulation to nanoscale bio-sensing. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Applied Physics Letters 
463 |t Vol. 118, iss. 13  |v [131107, 5 p.]  |d 2021 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a плазменные пучки 
610 1 |a оптическая микроскопия 
610 1 |a наночастицы 
610 1 |a свободные электроны 
610 1 |a металл-диэлектрик 
610 1 |a биосенсоры 
701 1 |a Minin  |b I. V.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Igor Vladilenovich  |3 (RuTPU)RU\TPU\pers\37571 
701 1 |a Minin  |b O. V.  |c physicist  |c professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Oleg Vladilenovich  |3 (RuTPU)RU\TPU\pers\44941 
701 1 |a Glinsky  |b I. A.  |g Igor Andreevich 
701 1 |a Khabibullin  |b R. A.  |g Rustam Anvarovich 
701 1 |a Malureanu  |b R.  |g Radu 
701 1 |a Lavrinenko  |b A. V.  |g Andrey Vladimirovich 
701 1 |a Yakubovsky  |b D. I.  |g Dmitry Igorevich 
701 1 |a Volkov  |b V. S.  |g Valentin Sergeevich 
701 1 |a Ponomarev  |b D. S.  |g Dmitry Sergeevich 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Отделение электронной инженерии  |3 (RuTPU)RU\TPU\col\23507 
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856 4 |u https://doi.org/10.1063/5.0043923 
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