Influence of electrode spacing and gas pressure on parameters of a runaway electron beam generating during the nanosecond breakdown in SF6 and nitrogen; High Voltage; Vol. 2, iss. 2

Bibliografiske detaljer
Parent link:High Voltage
Vol. 2, iss. 2.— 2017.— [P. 49-55]
Institution som forfatter: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Andre forfattere: Tarasenko V. F. Victor Fedotovich, Zhang Cheng, Kozyrev A. V. Andrey Vladimirovich, Sorokin D. A. Dmitry Alekseevich, Hou Xingmin, Semenyuk N. S. Nataljya Stepanovna, Burachenko A. G. Aleksandr Gennadjevich, Yan Ping, Kozhevnikov V. Yu. Vasily Yurjevich, Baksht E. Kh. Evgeny Khaimovich, Lomaev M. I. Mikhail Ivanovich, Tao Shao
Summary:Title screen
This study deals with experimental and theoretical simulation data showing the influence of electrode spacing and gas pressure on parameters of a supershort avalanche electron beam (SAEB) formed in SF6 and nitrogen at different rise times and amplitudes of a voltage pulse. Using GIN-55-01, VPG-30-200, and SLEP-150M pulsers, tubular cathodes with a diameter of 6 mm, as well as gaps of 3, 5, and 8 mm, it was shown that the SAEB current amplitude can both increase and decrease depending on an electrode spacing, a waveform and a rise time of the voltage pulse, as well as the pressure of SF6 and nitrogen. It was established as a result of simulation that maximal voltage across the gap during the process of generation of runaway electrons and the thickness of an anode foil have a major effect on the SAEB current pulse amplitude.
Режим доступа: по договору с организацией-держателем ресурса
Sprog:engelsk
Udgivet: 2017
Fag:
Online adgang:https://doi.org/10.1049/hve.2017.0014
Format: Electronisk Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664790

MARC

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200 1 |a Influence of electrode spacing and gas pressure on parameters of a runaway electron beam generating during the nanosecond breakdown in SF6 and nitrogen  |f V. F. Tarasenko, Zhang Cheng, A. V. Kozyrev [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 41 tit.] 
330 |a This study deals with experimental and theoretical simulation data showing the influence of electrode spacing and gas pressure on parameters of a supershort avalanche electron beam (SAEB) formed in SF6 and nitrogen at different rise times and amplitudes of a voltage pulse. Using GIN-55-01, VPG-30-200, and SLEP-150M pulsers, tubular cathodes with a diameter of 6 mm, as well as gaps of 3, 5, and 8 mm, it was shown that the SAEB current amplitude can both increase and decrease depending on an electrode spacing, a waveform and a rise time of the voltage pulse, as well as the pressure of SF6 and nitrogen. It was established as a result of simulation that maximal voltage across the gap during the process of generation of runaway electrons and the thickness of an anode foil have a major effect on the SAEB current pulse amplitude. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t High Voltage 
463 |t Vol. 2, iss. 2  |v [P. 49-55]  |d 2017 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a SF6 insulation 
610 1 |a avalanche breakdown 
610 1 |a nitrogen 
610 1 |a electrode spacing 
610 1 |a gas pressure 
610 1 |a runaway electron beam 
610 1 |a nanosecond breakdown 
610 1 |a supershort avalanche electron beam 
610 1 |a SAEB GIN-55-01 
610 1 |a VPG-30-200 
610 1 |a SLEP-150M pulsers 
610 1 |a SAEB current pulse amplitude 
610 1 |a anode foil 
610 1 |a tubular cathodes 
610 1 |a изоляция 
610 1 |a электроды 
610 1 |a газы 
610 1 |a убегающие электроны 
610 1 |a пробой 
610 1 |a электронные пучки 
610 1 |a генераторы импульсов 
610 1 |a фольгированные материалы 
610 1 |a катоды 
701 1 |a Tarasenko  |b V. F.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1946-  |g Victor Fedotovich  |3 (RuTPU)RU\TPU\pers\32090 
701 0 |a Zhang Cheng 
701 1 |a Kozyrev  |b A. V.  |g Andrey Vladimirovich 
701 1 |a Sorokin  |b D. A.  |g Dmitry Alekseevich 
701 0 |a Hou Xingmin 
701 1 |a Semenyuk  |b N. S.  |g Nataljya Stepanovna 
701 1 |a Burachenko  |b A. G.  |g Aleksandr Gennadjevich 
701 0 |a Yan Ping 
701 1 |a Kozhevnikov  |b V. Yu.  |g Vasily Yurjevich 
701 1 |a Baksht  |b E. Kh.  |g Evgeny Khaimovich 
701 1 |a Lomaev  |b M. I.  |g Mikhail Ivanovich 
701 0 |a Tao Shao 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Отделение электронной инженерии  |3 (RuTPU)RU\TPU\col\23507 
801 2 |a RU  |b 63413507  |c 20210519  |g RCR 
856 4 |u https://doi.org/10.1049/hve.2017.0014 
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