Determination of the test-samples electron density via dual energy computer tomography; Journal of Physics: Conference Series; Vol. 1843 : Information and Measuring Equipment and Technologies (IMET)

Бібліографічні деталі
Parent link:Journal of Physics: Conference Series
Vol. 1843 : Information and Measuring Equipment and Technologies (IMET).— 2021.— [012021, 5 р.]
Співавтори: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение ядерно-топливного цикла, Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Інші автори: Grigorieva (Grigorjeva) A. A. Anna Anatoljevna, Bulavskaya A. A. Angelina Aleksandrovna, Miloichikova I. A. Irina Alekseevna, Cherepennikov Yu. M. Yuriy Mihaylovich, Stuchebrov S. G. Sergey Gennadevich
Резюме:Title screen
In this work we determines electron density using data obtained via CT scanner with one radiation source operating in two modes: with 80 kV and 120 kV voltage. We perform tomography study of calibration phantom with predetermined electron densities. Single linear relationship between energy-subtracted Hounsfield unit and relative electron density is determined. Using determined relationship the relative electron densities of phantom calibration samples is calculated. The comparison of calculated and nominal values proves the possibility of the samples relative electron density determination using energy-subtracted Hounsfield unit with error less than 2%.
Мова:Англійська
Опубліковано: 2021
Предмети:
Онлайн доступ:http://earchive.tpu.ru/handle/11683/81008
https://doi.org/10.1088/1742-6596/1843/1/012021
Формат: Електронний ресурс Частина з книги
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664511

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