Analysis of the Vacancy System of Restructured Zinc by the Positron Annihilation Method; Technical Physics; Vol. 63, iss. 6
| Parent link: | Technical Physics: Physical Science of Materials.— , 1931- Vol. 63, iss. 6.— 2018.— [P. 834–837] |
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| সংস্থা লেখক: | |
| অন্যান্য লেখক: | , , , , , |
| সংক্ষিপ্ত: | Title screen We have obtained restructured zinc (high-purity zinc prepared by mechanothermal action of various intensity levels) and have analyzed its structure by the positron spectroscopy methods. Bulk vacancytype defects (vacancies and vacancy clusters), as well as the regions with an extended crystal lattice, have been discovered in the restructured samples and analyzed quantitatively. These effects are responsible for the emergence of internal microstresses in the material, which modify its properties. Режим доступа: по договору с организацией-держателем ресурса |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
2018
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| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://doi.org/10.1134/S106378421806021X |
| বিন্যাস: | বৈদ্যুতিক গ্রন্থের অধ্যায় |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664503 |
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| 200 | 1 | |a Analysis of the Vacancy System of Restructured Zinc by the Positron Annihilation Method |f E. M. Solovjev, B. V. Spitsyn, R. S. Laptev [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 20 tit.] | ||
| 330 | |a We have obtained restructured zinc (high-purity zinc prepared by mechanothermal action of various intensity levels) and have analyzed its structure by the positron spectroscopy methods. Bulk vacancytype defects (vacancies and vacancy clusters), as well as the regions with an extended crystal lattice, have been discovered in the restructured samples and analyzed quantitatively. These effects are responsible for the emergence of internal microstresses in the material, which modify its properties. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Technical Physics |o Physical Science of Materials |d 1931- | ||
| 463 | |t Vol. 63, iss. 6 |v [P. 834–837] |d 2018 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a аннигиляция | |
| 610 | 1 | |a позитронная спектроскопия | |
| 610 | 1 | |a дефекты | |
| 610 | 1 | |a микронапряжения | |
| 701 | 1 | |a Solovjev |b E. M. | |
| 701 | 1 | |a Spitsyn |b B. V. |g Boris Vladimirovich | |
| 701 | 1 | |a Laptev |b R. S. |c physicist, specialist in the field of non-destructive testing |c Associate Professor of Tomsk Polytechnic University, Doctor of Technical Sciences |f 1987- |g Roman Sergeevich |y Tomsk |3 (RuTPU)RU\TPU\pers\31884 |9 15956 | |
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| 701 | 1 | |a Mikhaylov |b A. A. |g Andrey Anatoljevich | |
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