Structural Modification of Graphene on Copper Substrates Irradiated by Nanosecond High-Intensity Ion Beam; Russian Physics Journal; Vol. 61, No. 8

Xehetasun bibliografikoak
Parent link:Russian Physics Journal
Vol. 61, No. 8.— 2018.— [P. 1443-1449]
Egile korporatiboa: Национальный исследовательский Томский политехнический университет Школа базовой инженерной подготовки Отделение русского языка, Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий"
Beste egile batzuk: Poddubskaya O. G. Olesya Germanovna, Kuzhir P. P. Polina Pavlovna, Stepanov A. V. Andrey Vladimirovich, Martynenko A. A. Aleksandra Aleksandrovna, Remnev (Remnyov) G. E. Gennady Efimovich
Gaia:Title screen
Interaction of a nanosecond high-intensity pulsed ion beam with thin graphene films on copper substrates is analyzed. Methods of Raman spectroscopy are used to investigate the degree of graphene degradation depending on the integral implanted dose. The role of the substrate in the structural degradation of graphene irradiated by charged particle beams is demonstrated using the software package SRIM, intended for modeling radiative defect cascades under irradiation by charged particle beams, and the data on radiation resistance of graphene available in the literature.
Режим доступа: по договору с организацией-держателем ресурса
Hizkuntza:ingelesa
Argitaratua: 2018
Gaiak:
Sarrera elektronikoa:https://doi.org/10.1007/s11182-018-1554-8
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664468
Deskribapena
Gaia:Title screen
Interaction of a nanosecond high-intensity pulsed ion beam with thin graphene films on copper substrates is analyzed. Methods of Raman spectroscopy are used to investigate the degree of graphene degradation depending on the integral implanted dose. The role of the substrate in the structural degradation of graphene irradiated by charged particle beams is demonstrated using the software package SRIM, intended for modeling radiative defect cascades under irradiation by charged particle beams, and the data on radiation resistance of graphene available in the literature.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1007/s11182-018-1554-8