Microstructure and properties of Ti-6.5Al-3.5Mo-1.5Zr-0.3Si parts produced by electron beam melting

Dettagli Bibliografici
Parent link:Journal of Physics: Conference Series
Vol. 1115 : 6th International Congress "Energy Fluxes and Radiation Effects", EFRE2018. 14th International Conference on Modification of Materials with Particle Beams and Plasma Flows (14th CMM).— 2018.— [042057, 5 p.]
Enti autori: Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий", Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научно-образовательный центр Б. П. Вейнберга
Altri autori: Pushilina N. S. Natalia Sergeevna, Kashkarov E. B. Egor Borisovich, Syrtanov M. S. Maksim Sergeevich, Kudiyarov V. N. Victor Nikolaevich, Laptev R. S. Roman Sergeevich, Gustomyasov M. Maksim, Kushnaryov Yu. V. Yury Vladimirovich, Fedorov V. V. Vasilii Viktorovich
Riassunto:Title screen
The aim of this work is to study the influence of electron beam current on the microstructure, structural-phase state and the change in microhardness of Ti-6.5Al-3.5Mo-1.5Zr-0.3Si alloy samples. The samples were fabricated by electron beam melting (EBM) at different beam currents (3-6 mA). The phase composition and microstructure were analyzed by X-ray diffraction and scanning electron microscopy, respectively. The peculiarities of structure and properties change of samples made by electron beam melting from Ti-6.5Al-3.5Mo-1.5Zr-0.3Si powder have been established, depending on the manufacturing parameters.
Pubblicazione: 2018
Soggetti:
Accesso online:https://doi.org/10.1088/1742-6596/1115/4/042057
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664397

Documenti analoghi