Universal installation for studying structural defects in electrical and optical fiber materials
| Parent link: | Journal of Physics: Conference Series Vol. 1499 : Actual Trends in Radiophysics.— 2020.— [012046, 9 р.] |
|---|---|
| Autor kompanije: | |
| Daljnji autori: | , , , , |
| Sažetak: | Title screen A universal device for experimentally studying the migration of microscopic structure defects and the features of dielectric relaxation is proposed. it allows using the thermo stimulated depolarization method, in combination with the measurement of the tangent of the angle of dielectric losses and the thermo stimulated polarization current, to perform dielectric spectroscopy of hydrogen-bonded crystals and perform analysis of the properties and parameters of structure defects. A smaller (in comparison with the existing installation) additional compact device for measuring small values of electrical capacitance and the tangent of the angle of dielectric losses, including an electrometer В7-30, was designed, measurement was carried out using a q-factor meter VM 560. When measuring tgδ ³ 1.0 , the VM-507 device was used. An experimental methodology is proposed that allows, in combination with the method of minimizing the comparison function (MFC - method), with a high degree of accuracy, to calculate the molecular characteristics of structural defects in composite materials based on semiconductors and dielectrics used in the electrical and optical fiber industry, electric power and insulation technology. |
| Jezik: | engleski |
| Izdano: |
2020
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| Teme: | |
| Online pristup: | https://earchive.tpu.ru/handle/11683/81009 https://doi.org/10.1088/1742-6596/1499/1/012046 |
| Format: | Elektronički Poglavlje knjige |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664339 |
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| 200 | 1 | |a Universal installation for studying structural defects in electrical and optical fiber materials |f V. A. Kalytka, M. V. Korovkin, P. Sh. Madi [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 24 tit.] | ||
| 330 | |a A universal device for experimentally studying the migration of microscopic structure defects and the features of dielectric relaxation is proposed. it allows using the thermo stimulated depolarization method, in combination with the measurement of the tangent of the angle of dielectric losses and the thermo stimulated polarization current, to perform dielectric spectroscopy of hydrogen-bonded crystals and perform analysis of the properties and parameters of structure defects. A smaller (in comparison with the existing installation) additional compact device for measuring small values of electrical capacitance and the tangent of the angle of dielectric losses, including an electrometer В7-30, was designed, measurement was carried out using a q-factor meter VM 560. When measuring tgδ ³ 1.0 , the VM-507 device was used. An experimental methodology is proposed that allows, in combination with the method of minimizing the comparison function (MFC - method), with a high degree of accuracy, to calculate the molecular characteristics of structural defects in composite materials based on semiconductors and dielectrics used in the electrical and optical fiber industry, electric power and insulation technology. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\3526 |t Journal of Physics: Conference Series | |
| 463 | |t Vol. 1499 : Actual Trends in Radiophysics |o 8 International Conference, 1-4 October 2019, Tomsk, Russian Federation |v [012046, 9 р.] |d 2020 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 701 | 1 | |a Kalytka |b V. A. |g Valery Aleksandrovich | |
| 701 | 1 | |a Korovkin |b M. V. |c geophysicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1952- |g Mikhail Vladimirovich |3 (RuTPU)RU\TPU\pers\32821 |9 16678 | |
| 701 | 1 | |a Madi |b P. Sh. | |
| 701 | 1 | |a Kalachyova |b S. A. | |
| 701 | 1 | |a Sidorina |b E. A. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа природных ресурсов |b Отделение нефтегазового дела |3 (RuTPU)RU\TPU\col\23546 |
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| 856 | 4 | |u https://earchive.tpu.ru/handle/11683/81009 |z https://earchive.tpu.ru/handle/11683/81009 | |
| 856 | 4 | |u https://doi.org/10.1088/1742-6596/1499/1/012046 | |
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