Universal installation for studying structural defects in electrical and optical fiber materials

Bibliografski detalji
Parent link:Journal of Physics: Conference Series
Vol. 1499 : Actual Trends in Radiophysics.— 2020.— [012046, 9 р.]
Autor kompanije: Национальный исследовательский Томский политехнический университет Инженерная школа природных ресурсов Отделение нефтегазового дела
Daljnji autori: Kalytka V. A. Valery Aleksandrovich, Korovkin M. V. Mikhail Vladimirovich, Madi P. Sh., Kalachyova S. A., Sidorina E. A.
Sažetak:Title screen
A universal device for experimentally studying the migration of microscopic structure defects and the features of dielectric relaxation is proposed. it allows using the thermo stimulated depolarization method, in combination with the measurement of the tangent of the angle of dielectric losses and the thermo stimulated polarization current, to perform dielectric spectroscopy of hydrogen-bonded crystals and perform analysis of the properties and parameters of structure defects. A smaller (in comparison with the existing installation) additional compact device for measuring small values of electrical capacitance and the tangent of the angle of dielectric losses, including an electrometer В7-30, was designed, measurement was carried out using a q-factor meter VM 560. When measuring tgδ ³ 1.0 , the VM-507 device was used. An experimental methodology is proposed that allows, in combination with the method of minimizing the comparison function (MFC - method), with a high degree of accuracy, to calculate the molecular characteristics of structural defects in composite materials based on semiconductors and dielectrics used in the electrical and optical fiber industry, electric power and insulation technology.
Jezik:engleski
Izdano: 2020
Teme:
Online pristup:https://earchive.tpu.ru/handle/11683/81009
https://doi.org/10.1088/1742-6596/1499/1/012046
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664339

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330 |a A universal device for experimentally studying the migration of microscopic structure defects and the features of dielectric relaxation is proposed. it allows using the thermo stimulated depolarization method, in combination with the measurement of the tangent of the angle of dielectric losses and the thermo stimulated polarization current, to perform dielectric spectroscopy of hydrogen-bonded crystals and perform analysis of the properties and parameters of structure defects. A smaller (in comparison with the existing installation) additional compact device for measuring small values of electrical capacitance and the tangent of the angle of dielectric losses, including an electrometer В7-30, was designed, measurement was carried out using a q-factor meter VM 560. When measuring tgδ ³ 1.0 , the VM-507 device was used. An experimental methodology is proposed that allows, in combination with the method of minimizing the comparison function (MFC - method), with a high degree of accuracy, to calculate the molecular characteristics of structural defects in composite materials based on semiconductors and dielectrics used in the electrical and optical fiber industry, electric power and insulation technology. 
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463 |t Vol. 1499 : Actual Trends in Radiophysics  |o 8 International Conference, 1-4 October 2019, Tomsk, Russian Federation  |v [012046, 9 р.]  |d 2020 
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701 1 |a Kalytka  |b V. A.  |g Valery Aleksandrovich 
701 1 |a Korovkin  |b M. V.  |c geophysicist  |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1952-  |g Mikhail Vladimirovich  |3 (RuTPU)RU\TPU\pers\32821  |9 16678 
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